Resonant inelastic hard x-ray scattering with diced analyzer crystals and position-sensitive detectors

Huotari, Simo; Albergamo, F.; Vankó, György; Verbeni, R.; Monaco, G.

doi:10.1063/1.2198805

Cited by 65 publications

(51 citation statements)

References 21 publications

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“…The scattering plane was vertical, i.e., perpendicular to the plane of linear polarization of the incident and scattered radiation. The detector was based on a Timepix chip, with a pixel size of 55 μm and enabling us to use the dispersion compensation algorithm [29,30]. The analyzer Bragg angle was fixed at 87…”

Section: Methodsmentioning

confidence: 99%

Exciton energy-momentum map of hexagonal boron nitride

et al. 2015

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Understanding and controlling the way excitons propagate in solids is a key for tailoring materials with improved optoelectronic properties. A fundamental step in this direction is the determination of the exciton energy-momentum dispersion. Here, thanks to the solution of the parameter-free Bethe-Salpeter equation (BSE), we draw and explain the exciton energy-momentum map of hexagonal boron nitride (h-BN) in the first three Brillouin zones. We show that h-BN displays strong excitonic effects not only in the optical spectra at vanishing momentum q, as previously reported, but also at large q. We validate our theoretical predictions by assessing the calculated exciton map by means of an inelastic x-ray scattering (IXS) experiment. Moreover, we solve the discrepancies between previous experimental data and calculations, proving then that the BSE is highly accurate through the whole momentum range. Therefore, these results put forward the combination BSE and IXS as the tool of choice for addressing the exciton dynamics in complex materials.

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Section: Methodsmentioning

confidence: 99%

Exciton energy-momentum map of hexagonal boron nitride

et al. 2015

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“…With the incident beam brought in perpendicular to the Rowland plane, this geometry is used for combined imaging and spectroscopic measurements in many plasma physics studies as well as in some synchrotron applications. [51][52][53] Finally, in Fig. 1(c) and of direct relevance here, a largespot illumination of a sample off the Rowland circle has an effective collection of "virtual" sources at different energies, as in panel (a).…”

Section: The Dispersive Refocusing Rowland (Drr) Geometrymentioning

confidence: 99%

A compact dispersive refocusing Rowland circle X-ray emission spectrometer for laboratory, synchrotron, and XFEL applications

Holden

Hoidn

Ditter

et al. 2017

Review of Scientific Instruments

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Articles you may be interested inCCD camera as feasible large-area-size x-ray detector for x-ray fluorescence spectroscopy and imaging Review of Scientific Instruments 88, 063703 (2017) (Received 25 April 2017; accepted 6 July 2017; published online 27 July 2017) X-ray emission spectroscopy is emerging as an important complement to x-ray absorption fine structure spectroscopy, providing a characterization of the occupied electronic density of states local to the species of interest. Here, we present details of the design and performance of a compact x-ray emission spectrometer that uses a dispersive refocusing Rowland (DRR) circle geometry to achieve excellent performance for the 2-2.5 keV range, i.e., especially for the K-edge emission from sulfur and phosphorous. The DRR approach allows high energy resolution even for unfocused x-ray sources. This property enables high count rates in laboratory studies, approaching those of insertion-device beamlines at third-generation synchrotrons, despite use of only a low-powered, conventional x-ray tube. The spectrometer, whose overall scale is set by use of a 10-cm diameter Rowland circle and a new small-pixel complementary metal-oxide-semiconductor x-ray camera, is easily portable to synchrotron or x-ray free electron laser beamlines. Photometrics from measurements at the Advanced Light Source show excellent overall instrumental efficiency. In addition, the compact size of this instrument lends itself to future multiplexing to gain large factors in net collection efficiency or its implementationincontrolledgasgloveboxeseitherinthelaborinanendstation.

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“…Because the incident energy is chosen by the absorption edges of the system, keeping high energy resolution in RIXS is not a trivial task. Significant efforts have been made to improve the energy resolution to probe fine electronic structures, including Bragg angle close to back-scattering geometry and the use of diced crystals coupled with an area detector [274,277]. For RIXS using MERIX instruments, only a limited number of suitable analyzers have been established [278].…”

Section: Hp Resonant Inelastic X-ray Scatteringmentioning

confidence: 99%

High-pressure studies with x-rays using diamond anvil cells

2016

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Pressure profoundly alters all states of matter. The symbiotic development of ultrahighpressure diamond anvil cells, to compress samples to sustainable multi-megabar pressures; and synchrotron x-ray techniques, to probe materials' properties in situ, has enabled the exploration of rich high-pressure (HP) science. In this article, we first introduce the essential concept of diamond anvil cell technology, together with recent developments and its integration with other extreme environments. We then provide an overview of the latest developments in HP synchrotron techniques, their applications, and current problems, followed by a discussion of HP scientific studies using x-rays in the key multidisciplinary fields. These HP studies include: HP x-ray emission spectroscopy, which provides information on the filled electronic states of HP samples; HP x-ray Raman spectroscopy, which probes the HP chemical bonding changes of light elements; HP electronic inelastic x-ray scattering spectroscopy, which accesses high energy electronic phenomena, including electronic band structure, Fermi surface, excitons, plasmons, and their dispersions; HP resonant inelastic x-ray scattering spectroscopy, which probes shallow core excitations, multiplet structures, and spin-resolved electronic structure; HP nuclear resonant x-ray spectroscopy, which provides phonon densities of state and time-resolved Mössbauer information; HP x-ray imaging, which provides information on hierarchical structures, dynamic processes, and internal strains; HP x-ray diffraction, which determines the fundamental structures and densities of single-crystal, polycrystalline, nanocrystalline, and non-crystalline materials; and HP radial x-ray diffraction, which yields deviatoric, elastic and rheological information. Integrating these tools with hydrostatic or uniaxial pressure media, laser and resistive heating, and cryogenic cooling, has enabled investigations of the structural, vibrational, electronic, and magnetic properties of materials over a wide range of pressure-temperature conditions.

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Resonant inelastic hard x-ray scattering with diced analyzer crystals and position-sensitive detectors

Cited by 65 publications

References 21 publications

Exciton energy-momentum map of hexagonal boron nitride

Exciton energy-momentum map of hexagonal boron nitride

A compact dispersive refocusing Rowland circle X-ray emission spectrometer for laboratory, synchrotron, and XFEL applications

High-pressure studies with x-rays using diamond anvil cells

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