Resonant inelastic soft x-ray scattering of CdS: A two-dimensional electronic structure map approach

Abstract

Resonant inelastic x-ray scattering (RIXS) with soft x-rays is uniquely suited to study the electronic structure of a variety of materials, but is currently limited by low (fluorescence yield) count rates. This limitation is overcome with a new high-transmission spectrometer that allows to measure soft x-ray RIXS "maps". The S L 2,3 RIXS map of CdS is discussed and compared with density functional calculations. The map allows the extraction of decay channel-specific "absorption spectra", giving detailed insight into the wave functions of occupied and unoccupied electronic states.

RIXS investigations of liquids, solutions, and liquid/solid interfaces

“…The high transmission enables us to measure an emission spectrum at each energy point of a conventional absorption spectrum, with a total measuring time of less than 1 h. The data can then be presented in a RIXS map, showing the color-coded emission intensity as a function of excitation and emission energy [40,41]. Such RIXS maps contain the most comprehensive electronic structure information of both occupied and unoccupied valence states of the investigated material available by any experimental approach.…”

First-principles calculation of resonant x-ray emission spectra applied to ZnO

“…However, there are few reports in the literature where the coherent part of the RXES (CRXES) have actually been calculated with ab initio techniques, especially where the electronic structure requires an in depth treatment. [4][5][6][7] In this paper we present the results of an implementation of the Kramers-Heisenberg equation on top of a quasisiparticle self-consistent (QS)-GW band structure calculation. We give full consideration to the effect of dipole selection rules on the incoming and outgoing photons in different polarization and experimental geometries, enabling us to calculate spectra that are directly comparable to experiment.…”

Electron-hole correlation effects in core-level spectroscopy probed by the resonant inelastic soft x-ray scattering map of C60

“…19 This allows us to collect an x-ray emission spectrum at each data point of a conventional x-ray absorption spectrum, resulting in a twodimensional RIXS map. 20 For the present experiments, both x-ray spectrometer and beamline had a resolution <250 meV. For comparison, a PES valence band spectrum and an Augeryield (AY) XAS spectrum were recorded at beamline UE52-PGM of the Berliner Gesellschaft für Synchrotronstrahlung (BESSY) using a Scienta R4000 electron analyzer.…”