2015
DOI: 10.1016/j.solidstatesciences.2015.02.007
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Revisit: High resolution charge density study of α-rhombohedral boron using third-generation SR data at SPring-8

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Cited by 12 publications
(13 citation statements)
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“…The asymmetric unit features polar atoms B p , which form short and strong (2c,2e) exo-bonds with neighboring icosahedra, as well as equatorial atoms B e forming somewhat weaker (3c,2e) exo-bonds connecting three icosahedra, see Figure 2 . The lengths of the B p -B p and B e -B e exo-bonds (1.66879(14) & 2.00945(19) Å, as obtained from the HCM refinement of experimental structure factors F exp ) are in very good agreement with the single crystal studies of Mondal et al (1.6733(5) & 2.0144(3) Å) as well as the synchrotron powder MEM-studies of Nishibori et al (1.6676(4) & 2.0105(4) Å) [ 45 , 49 ].…”
Section: Resultssupporting
confidence: 88%
See 1 more Smart Citation
“…The asymmetric unit features polar atoms B p , which form short and strong (2c,2e) exo-bonds with neighboring icosahedra, as well as equatorial atoms B e forming somewhat weaker (3c,2e) exo-bonds connecting three icosahedra, see Figure 2 . The lengths of the B p -B p and B e -B e exo-bonds (1.66879(14) & 2.00945(19) Å, as obtained from the HCM refinement of experimental structure factors F exp ) are in very good agreement with the single crystal studies of Mondal et al (1.6733(5) & 2.0144(3) Å) as well as the synchrotron powder MEM-studies of Nishibori et al (1.6676(4) & 2.0105(4) Å) [ 45 , 49 ].…”
Section: Resultssupporting
confidence: 88%
“…The new findings were at first in contrast to two earlier independent charge density studies based on synchrotron powder data (sin( θ )/ λ ≤ 0.75 Å −1 ) evaluated by the maximum entropy method (MEM), which suggested a strongly bent nature of the intericosahedral (2c,2e) bond [ 46 , 47 , 48 ]. However, it was shown by Nishibori et al in a synchrotron powder experiment conducted at the beamline BL44B2 (SPring-8, Japan) with resolutions up to sin( θ )/ λ ≤ 1.529 Å −1 at T = 100 K that the earlier powder diffraction results were biased by systematic errors which disappear at resolutions above sin( θ )/ λ ≤ 1.25 Å −1 when the MEM technique is used [ 49 ].…”
Section: Introductionmentioning
confidence: 99%
“…The cases of silicon and diamond indicate that the MEM charge density analysis of SXPD data is a promising tool to visualize materials properties, e.g. chemical bond and electrostatic properties [5,17,18,[24][25][26][27][28][29][30][31][32]. …”
Section: Charge Density Studiesmentioning
confidence: 99%
“…The experimental procedure we developed has been widely applied to accurate charge density studies of materials such as α-boron20, TiO 2 21, Al 2 O 3 21, CoSb 3 2223, silicon24 and diamond2425. The technique successfully determined the detailed charge density features which were quantitatively comparable to those determined theoretically17202122232425. Recently, the charge density studies from ultra-high resolution synchrotron radiation powder diffractions have been reported using an all-in-vacuum diffractometer installed at PETRA-III26.…”
mentioning
confidence: 99%