2007
DOI: 10.1016/j.susc.2007.04.215
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RHEED and XPS study of Pd–Sn bimetallic system growth

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Cited by 12 publications
(2 citation statements)
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“…HOPG sample consists of randomly oriented domains, all of which have the (0001) plane parallel to the surface. As a result, one can observe the diffraction spots from all the possible planes at the same time [46]. Figure 1 shows the diffraction pattern from a clean HOPG surface.…”
Section: Epitaxial Growth Of Si On Hopgmentioning
confidence: 96%
“…HOPG sample consists of randomly oriented domains, all of which have the (0001) plane parallel to the surface. As a result, one can observe the diffraction spots from all the possible planes at the same time [46]. Figure 1 shows the diffraction pattern from a clean HOPG surface.…”
Section: Epitaxial Growth Of Si On Hopgmentioning
confidence: 96%
“…It is thus interesting to consider tin; its role in these systems is usually connected (correlated) with the modification of Pd d-band and consequently related with particle adsorption properties. X-ray photoelectron spectroscopy (XPS) investigation of Pd-Sn alloy indicated a strong bimetallic interaction resulting in a noble metal-like electronic structure [35][36][37][38]. Therefore, a great effort has been made to investigate bimetallic systems based on palladium and tin in order to prepare novel catalysts for various applications .…”
Section: Introductionmentioning
confidence: 99%