Robust graphene wet transfer process through low molecular weight polymethylmethacrylate

Kim, Seonyeong; Shin, Somyeong; Kim, Taekwang; Du, Hyewon; Song, Minho; Lee, Chang-Won; Kim, Ki-Soo; Cho, Seungmin; Seo, David H.; Seo, Sunae

doi:10.1016/j.carbon.2015.11.027

Cited by 56 publications

(40 citation statements)

References 31 publications

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“…Figure 2 shows clearly that the two measurements are not coherent with each other, and that there is a systematic overestimation of the O/Cfit values in the published data. In fact, estimation of O/C ratios of GRMs deposited on oxygen-rich substrates such as SiOx, mica, glass or steel are likely to be inaccurate [23] suggesting that studies presenting a chemical analysis of graphene-based devices insitu [24][25][26][27][28] could be affected by an intrinsic overestimation of the oxygen content.…”

Section: An Important Step In This Direction Has Recently Been Taken mentioning

confidence: 99%

Accurate chemical analysis of oxygenated graphene-based materials using X-ray photoelectron spectroscopy

Kovtun

Jones

Dell’Elce

et al. 2019

Carbon

237

121

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A simple, fast and general protocol for quantitative analysis of X-ray photoelectron spectroscopy (XPS) data provides accurate estimations of chemical species in graphene and related materials (GRMs). XPS data are commonly used to estimate the quality of and defects in graphene and graphene oxide (GO), by comparing carbon and oxygen 1s XPS peaks, obtaining an O/C ratio. This approach, however, cannot be used in the presence of extraneous oxygen contamination. The protocol, based on quantitative line-shape analysis of C 1s signals, uses asymmetric pseudo-Voigt line-shapes (APV), in contrast to Gaussian-based approaches conventionally used in fitting XPS spectra, thus allowing better accuracy in quantifying C 1s contributions from graphitic carbon (sp 2), defects (sp 3 carbon), carbons bonded to hydroxyl and epoxy groups, and from carbonyl and carboxyl groups. The APV protocol was evaluated on GRMs with O/C ratios ranging from 0.02 to 0.30 with film thicknesses from monolayers to bulk-like (>30nm) layers and also applied to previously published data, showing better results compared to those from conventional XPS fitting protocols. Based uniquely on C 1s data, the APV protocol can quantify O/C ratio and the presence of specific functional groups in GRMs even on SiOx, substrates, or in samples containing water.

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Section: An Important Step In This Direction Has Recently Been Taken mentioning

confidence: 99%

Accurate chemical analysis of oxygenated graphene-based materials using X-ray photoelectron spectroscopy

Kovtun

Jones

Dell’Elce

et al. 2019

Carbon

237

121

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“…C1s spectrum contains just two dominant bands on binding energy roughly within the range of 284.4-284.75 eV and 288.6-288.7 eV. The first one relates to the C=C − sp2 bounds of graphitic carbon (graphene) and the second one belongs to an unspecified bound C-O [16][17]. Table 3 contains the proportional ratio of elements detected on the surface of graphene layers prepared from the structures containing nickel and copper.…”

Section: Xps Spectroscopymentioning

confidence: 99%

Graphene growth from the metal/carbon/SiO₂ structure

Macháč

Pajtai

2018

Journal of Electrical Engineering

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The paper presents results related to graphene growth by the method of precipitation on the boundary between a transition metal (nickel or cobalt) and a dielectric (SiO2 ). The source of graphene is a thin evaporated carbon layer. Carbon in the annealing process diffunds through the transition metal and precipitates on the surface of the dielectric substrate as the structure cools down. Relatively thick layer of copper, which is evaporated over carbon as a cover, prevents carbon to diffund to the surface of the metallization. The structure of the metallization for graphene forming is then Cu/C/(transition metal)/SiO2 /Si. We consider the utilization of the diffusion barrier to be the contribution of our work to graphene formation using this method. Even though both transition metals are of similar features, the necessary conditions for growth of high- quality graphene are different. In case of nickel, long annealing times within the whole range of annealing temperatures are necessary, while in case of structures with cobalt annealing time of 20 minutes at 900°C is enough for graphene growth. By annealing the Cu(300 nm)/C(20 nm)/Ni(50 nm)/SiO2 structure at the temperature of 800 °C for 60 minutes we obtained single-layer graphene (SLG).

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“…Transfer of nanomaterials from its original substrate is one of the key components for the fabrication of the heterogeneously integrated functional systems [7]. Most transfer technologies require mediator-assisted materials including macromolecular polymers and small organic molecules [8][9][10], which inevitably lead to processspecific drawbacks [11][12][13][14][15], limiting the performance of the final flexible devices. For example, polymethylmethacrylate (PMMA) and thermal-release tapes are widely used mediators, for which the polymer/tape residuals have to be removed using organic solvents and perhaps subsequent high-temperature annealing [16].…”

Section: Introductionmentioning

confidence: 99%

Sugar transfer of nanomaterials and flexible electrodes

Hong

Shen

Yang

et al. 2020

International Journal of Smart and Nano Materials

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Nanomaterials with various dimensionalities (e.g., nanowires, nanofilms, two-dimensional materials, and three-dimensional nanostructures) have shown great potential in the recent development of flexible electronics. Conventionally, organic solvents are inevitable while integrating nanomaterials onto flexible substrates, where polymer mediator-assisted transfer techniques are involved. This often damages the flexible substrate and thus hamper the large-scale application of nanomaterials. Here we report a method using watersoluble sugar as a mediator to facilely transfer nanomaterials onto rigid or flexible substrates. This method requires no organic solvent during transfer. More importantly, the morphology and properties of transferred nanomaterials, such as shape, microstructure, resistivity, and transmittance are well preserved on the target substrate. We believe that this universal and rapid transfer method can greatly advance the applications of nanomaterials in the field of flexible devices and beyond. ARTICLE HISTORY

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Robust graphene wet transfer process through low molecular weight polymethylmethacrylate

Cited by 56 publications

References 31 publications

Accurate chemical analysis of oxygenated graphene-based materials using X-ray photoelectron spectroscopy

Accurate chemical analysis of oxygenated graphene-based materials using X-ray photoelectron spectroscopy

Graphene growth from the metal/carbon/SiO₂ structure

Sugar transfer of nanomaterials and flexible electrodes

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Robust graphene wet transfer process through low molecular weight polymethylmethacrylate

Cited by 56 publications

References 31 publications

Accurate chemical analysis of oxygenated graphene-based materials using X-ray photoelectron spectroscopy

Accurate chemical analysis of oxygenated graphene-based materials using X-ray photoelectron spectroscopy

Graphene growth from the metal/carbon/SiO2 structure

Sugar transfer of nanomaterials and flexible electrodes

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Product

Resources

About

Graphene growth from the metal/carbon/SiO₂ structure