2017
DOI: 10.20546/ijcmas.2017.605.207
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Scanning Electron Microscope: Advantages and Disadvantages in Imaging Components

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Cited by 55 publications
(26 citation statements)
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“…In addition to improving the quality of the analyzed images, the coating also reduces the thermal damage on the sample due to charge build-up [13]. Components of SEM device for surface magnification of membranes [14]. SEM can measure the thickness of the dense layer too by cutting the membrane and analyzing the cross-section area.…”
Section: Sample Preparationmentioning
confidence: 99%
“…In addition to improving the quality of the analyzed images, the coating also reduces the thermal damage on the sample due to charge build-up [13]. Components of SEM device for surface magnification of membranes [14]. SEM can measure the thickness of the dense layer too by cutting the membrane and analyzing the cross-section area.…”
Section: Sample Preparationmentioning
confidence: 99%
“…TEM is one the most employed techniques in the characterization of carbon nanomaterials, as it allows the distinction of similar-looking nanomaterials that, otherwise, might be confused when resorting to scanning electron microscopy [ 103 ]. SEM uses focused electron beams, focusing incidental electrons onto the sample, producing electron scattering triggered by the interaction between the electrons and the sample atoms [ 104 ]. TEM and SEM share several features, and both are capable of discerning particle agglomeration to assess if adequate particle dispersion was accomplished.…”
Section: Characterization Methodsmentioning
confidence: 99%
“…After fixation, tissues were rinsed thoroughly in 0.1 M phosphate buffer to wash off the excess fixative, followed by postfixation in 1% solution of osmium tetraoxide. The tissues were dehydrated by passing through a series of ascending concentrations of ethanol or acetone (Choudhary and Priyanka, 2017). Clearing of tissues was done by xylene or toluene.…”
Section: Processing Of the Samples For Temmentioning
confidence: 99%