2019
DOI: 10.3762/bjnano.10.12
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Scanning probe microscopy for energy-related materials

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Cited by 3 publications
(3 citation statements)
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“…Kelvin probe force microscopy (KPFM) provides nanoscale surface potential measurements, giving insight into Fermi levels in conductors and semiconductors, or localized charges in insulators. As a technique based on atomic force microscopy (AFM), KPFM offers high spatial resolution, typically around 30–100 nm under ambient conditions. It has seen widespread application in the study of semiconductors, photovoltaics, and photocatalysts. KPFM works by inducing electron migration between a conductive or semiconductive sample and an electrically connected metallic AFM tip, establishing an electrical potential relative to the contact potential difference (CPD) between them. By measuring the effect of the Coulombic force between the tip and the sample, KPFM determines the CPD by applying a dc bias to null the electric potential, providing insights into the surface potential of the sample.…”
mentioning
confidence: 99%
“…Kelvin probe force microscopy (KPFM) provides nanoscale surface potential measurements, giving insight into Fermi levels in conductors and semiconductors, or localized charges in insulators. As a technique based on atomic force microscopy (AFM), KPFM offers high spatial resolution, typically around 30–100 nm under ambient conditions. It has seen widespread application in the study of semiconductors, photovoltaics, and photocatalysts. KPFM works by inducing electron migration between a conductive or semiconductive sample and an electrically connected metallic AFM tip, establishing an electrical potential relative to the contact potential difference (CPD) between them. By measuring the effect of the Coulombic force between the tip and the sample, KPFM determines the CPD by applying a dc bias to null the electric potential, providing insights into the surface potential of the sample.…”
mentioning
confidence: 99%
“…To elucidate the effect of nanoconfinement on electrical properties, we measured nanoscale electrical properties of nanopillars using cSFM. The cSFM is operated in the quantitative imaging (QI) mode, where we measure the local conductance pixel‐by‐pixel . The QI‐mode minimizes lateral forces between the tip and the nanopillars (Figure S8, Supporting Information) .…”
mentioning
confidence: 99%
“…The cSFM is operated in the quantitative imaging (QI) mode, where we measure the local conductance pixel-by-pixel. [48][49][50][51] The QI-mode minimizes lateral forces between the tip and the nanopillars ( Figure S8, Supporting Information). [30,52,53] Thus, arrays of nanopillars with high density and aspect ratio can be measured without distortion or destruction of fragile sample features.…”
mentioning
confidence: 99%