PIXEand Material Analysis

Abstract

Particle induced X‐ray emission spectroscopy (PIXE) used with other complementary ion beam techniques is a well‐established method to measure the elemental composition of the surface of archaeological and historical materials. PIXE measurements are non‐destructive and require just a few minutes. The detection limits of PIXE may reach some μg/g. It is possible to analyze objects and samples directly using external beam devices in order to identify materials and to infer provenance of raw materials, and techniques of manufacture. Also, microbeam systems provide elemental maps of major and trace elements. PIXE can be successfully applied to practically all kinds of inorganic materials and objects from the archaeological record: pottery, stone objects (obsidian, flints, jade), gems, metallic artifacts, glaze, glass, bone and teeth, manuscripts, and paintings. Samples and objects need to be transported to an accelerator laboratory; this is the main limitation for the application of this technique.