IEEE Trans. Power Electron.
 2023
DOI: 10.1109/tpel.2023.3279674
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Search Method of Robust Gate Driving Vectors for Digital Gate Drivers With Low Test Cost Against Load Current and Temperature Variations in IGBTs

Tingwei Wang
1
,
Toshiaki Inuma
2
,
Po-Hung Chen
3
et al.
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