1958
DOI: 10.1016/s0081-1947(08)60728-6
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Secondary Electron Emission

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Cited by 223 publications
(49 citation statements)
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“…The reason was that the difference in the dielectric constant's influence on the potential line distribution near triple junction (vacuum, insulator, and electrode junction of the three). The higher the dielectric constant was, the greater the influence of electric field lines [15,16]. This leads to the electric potential lines near triple junction concentrate in the gap and field strength near triple junction increase dramatically.…”
Section: Mechanism Of Flashover Voltage Improvementmentioning
confidence: 99%
“…The reason was that the difference in the dielectric constant's influence on the potential line distribution near triple junction (vacuum, insulator, and electrode junction of the three). The higher the dielectric constant was, the greater the influence of electric field lines [15,16]. This leads to the electric potential lines near triple junction concentrate in the gap and field strength near triple junction increase dramatically.…”
Section: Mechanism Of Flashover Voltage Improvementmentioning
confidence: 99%
“…The time lag of secondary emission is estimated to be 10 -13 to 10 -14 s, which is much shorter than any timescale relevant to electron-cloud effects. 30 Thus, we assume that the secondary electrons are generated instantaneously when a primary electron hits the lead glass surface.…”
Section: Model and Computational Algorithmmentioning
confidence: 99%
“…This in turn will change the light absorption characteristics and also may create traps for holes and electrons (so called V and F centres) and all these together will affect the shape of the quantum efficiency curves as well as the absolute value of the QE (see for example Ref. [30]). It is known that heat treatment changes the population and dynamics of the additional levels and thus causes changes in QE.…”
Section: Other Factors Contributing To the Pc Qe And Its Evolution Inmentioning
confidence: 99%