Selective Current‐Injected Electroluminescence Imaging for Series Resistance Feature Identification

Abstract

Herein, an electroluminescence (EL)‐based imaging method to detect broken fingers in solar cells is presented. The method is based on the ratio of two EL images taken with different paths of the injected current. The resultant high‐contrast images allow unambiguous separation of various series resistance‐related problems and hence the potential application of identifying broken fingers. The method can be applied to solar cells with both full and partial rear contacts. It can be easily implemented in commercial luminescence imaging systems, significantly extending their capabilities.

Investigation of Degradation of Solar Photovoltaics: A Review of Aging Factors, Impacts, and Future Directions toward Sustainable Energy Management

“…The strength and dispersion of the photoluminescence or EL signal that is released, the homogeneity of the cell surface, and the presence of flaws or other irregularities in the cell structure are some frequent metrics employed in UV-PL and EL imaging. These metrics can be used to evaluate the overall performance and quality of a solar cell as well as to identify and measure the degree of damage in the cell [85]. Bdour et al present a summary of data collected from various projects in Jordan to explain the impact of each micro-crack form on power loss and to guide decision-makers in replacing failed panels according to their terms of exchange [86].…”