Semiderivative real filter for microoptical elements quality control

Kasztelanic, Rafał; Sagan, Arkadiusz

doi:10.1007/s10043-009-0047-y

Cited by 6 publications

(3 citation statements)

References 16 publications

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“…A possible solution is the use of spatial frequency filters where the intensity signal at the output of the setup carries information about the phase of the object examined, and is easy to interpret. The group includes the linearly graded filter (Settles, 2001), and the semiderivative filter (the square root filter) (Kasztelanic & Sagan, 2009).…”

Section: Methods Based On Modifying the Spatial Frequencymentioning

confidence: 99%

Applications and Experiences of Quality Control

Ivanov¹

2011

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Ognyan Ivanov graduated from the Physics Department of the Sofia University "St. Kliment Ohridski". He received his PhD degree from the Georgi Nadjakov Institute of Solid State Physics (ISSP), Bulgarian Academy of Sciences in Sofia, Bulgaria, where he is currently employed. His research activity is in the area of electromagnetic interactions with solids and is concentrated on the creation of various methods for control of materials and processes, mainly in the field of quality control. The methods can be used for the control of solids, liquids and gases. Dr Ivanov is an author and co-author of 54 publications in scientific journals and books, including four invited papers, and he has participated in 26 international conferences. He has worked as a member or leader in 14 projects of ISSP with organizations outside of the Academy. Prof. Ivanov also teaches physics at the University of Architecture, Civil Engineering and Geodesy in Sofia. He is a member of national and international scientific organizations, editorial boards and has also received awards at exhibitions for inventors and innovations.

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Section: Methods Based On Modifying the Spatial Frequencymentioning

confidence: 99%

Applications and Experiences of Quality Control

Ivanov¹

2011

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“…The whole process of examining the phase object can be described in the following way [22][23][24][25] . The distorted wavefront is directed to the first lens (L1 - Figure 1a).…”

Section: Amplitude Semiderivative Real Filtermentioning

confidence: 99%

Semi-derivative real filter for the measurement of the wavefront distortion

Kasztelanic

Barański

2010

SPIE Proceedings

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The paper deals with a computer simulation and an experimental realization of a new kind of an optical setup for simple and fast control of the wavefront distortion. The method is based on a 4f coherent light correlator setup with a semiderivative real filter placed in the Fourier plane. In the setup described the distorted wavefront passes through the filter located in the frequency plane of the correlator. In the output plane a camera registers the intensity of light whose gradient carries information about the shape of the wavefront distortion. The output image is simple to analyze and interpret because the intensity is directly proportional to the first derivative of the distortion of the input wavefront.The role of the computer simulations presented in the paper was, first of all, to check how the semiderivative real filter deals with various kinds and levels of distortions. Secondly, it was to estimate how the technical limitations of the filter and the setup can influence the quality of the results obtained.The experiment checked the possibility of using the setup for examining the distortion of wavefront caused by hot air. The experimental results obtained show that the method is suitable and effective for real-time monitoring of the distortion of the wavefront, which allows for its use in adaptive optics and phase visualization. The method also allows for measuring other phase objects where the gradient of the phase and the thickness of the object undergo abrupt changes.

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“…The Shack-Hartmann (S-H) sensor [1] is a device commonly used for measuring wavefront distortion. Other devices or methods allowing for the similar measurements are: phase-shift [2] and shearing [3] interferometry methods, laser ray tracing, curvature sensor [4], pyramid wavefront sensor [5], spatially resolved refractometry and methods based on such spatial filters as the semiderivative filter [6,7]. The wavefront distortion, i.e.…”

Section: Introductionmentioning

confidence: 99%

High resolution Shack-Hartmann sensor based on array of nanostructured GRIN lenses

Kasztelanic¹,

Filipkowski²,

Pysz³

et al. 2017

Opt. Express

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We present a novel method for the development of a micro lenslets hexagonal array. We use gradient index (GRIN) micro lenses where the variation of the refraction index is achieved with a structure of nanorods made of 2 types of glasses. To develop the GRIN micro lens array, we used a modified stack-and-draw technology which was originally applied for the fabrication of photonic crystal fibers. This approach results in a completely flat element that is easy to integrate with other optical components and can be effectively used in high refractive index medium as liquids. As a proof-of-concept of the method we present a hexagonal array of 469 GRIN micro lenses with a diameter of 20 µm each and 100% fill factor. The GRIN lens array is further used to build a Shack-Hartmann detector for measuring wavefront distortion. A 50 lens/mm sampling density is achieved.

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Semiderivative real filter for microoptical elements quality control

Cited by 6 publications

References 16 publications

Applications and Experiences of Quality Control

Applications and Experiences of Quality Control

Semi-derivative real filter for the measurement of the wavefront distortion

High resolution Shack-Hartmann sensor based on array of nanostructured GRIN lenses

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