1977
DOI: 10.2172/7220317
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Semiscale Mod-1 system response during the ECC baseline test series (design of the Mod-1 baseline ECC test). [PWR]

Abstract: The author wishes. to express his, thanks to. the. Semisqak• 'Fest Support: Branch personnel for their efforts in conducting the tests and. for acquisition; verification,. and• documentation of the data; to the personnel of the Semiscale Data Processing SecW::m for providing data processing support; to• C. E: Cartmill and 0; J. Hansen for technical support; to K.-A. Dietz for editing and improving the quality of the report; and to Keri Johnston'and Elinor Witbeck for typing the various. drafts.

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