2017
DOI: 10.1016/j.solmat.2016.10.053
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Sentaurus modelling of 6.9% Cu2ZnSnS4 device based on comprehensive electrical & optical characterization

Abstract: In this work we perform comprehensive characterization on a 6.9% pure sulphide Cu 2 ZnSnS 4 (CZTS) device and construct a 2D device model in Sentaurus TCAD to identify possible roots of performance bottlenecks. Electrical and optical parameters of the absorber from comprehensive electrical and optical characterization, together with other necessary parameters from literature, we successfully reproduce measured current density-voltage (J-V) and external quantum efficiency (EQE) curves. Absorption coefficient is… Show more

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Cited by 25 publications
(24 citation statements)
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“…To be consistent with the reported literature, theories, or reasonable estimates, capture cross sections are fixed at 1.0 · 10 À12 cm 2 for electrons and 1.0 · 10 À15 cm 2 for holes at donor-type defect and at 1.0 · 10 À15 cm 2 for electrons and 1.0 · 10 À12 cm 2 for acceptor-type defect [12,[28][29][30][31][33][34][35][36][37]. For a comparative study of the ideal device in the previous section, the device structure is updated with very thin (5 nm) defective interface layer between CdS and CZTSSe.…”
Section: Trend By Defect Distribution and Concentrationmentioning
confidence: 81%
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“…To be consistent with the reported literature, theories, or reasonable estimates, capture cross sections are fixed at 1.0 · 10 À12 cm 2 for electrons and 1.0 · 10 À15 cm 2 for holes at donor-type defect and at 1.0 · 10 À15 cm 2 for electrons and 1.0 · 10 À12 cm 2 for acceptor-type defect [12,[28][29][30][31][33][34][35][36][37]. For a comparative study of the ideal device in the previous section, the device structure is updated with very thin (5 nm) defective interface layer between CdS and CZTSSe.…”
Section: Trend By Defect Distribution and Concentrationmentioning
confidence: 81%
“…The absorption coefficient, α(λ) was taken from Ref. [28] and the front surface recombination velocity (S f ), the default depletion width is 0.3 µm, and the electron lifetime (τ n )w e re1 0 3 cm/s and 10 À9 s [29,30]. In Figure 3, the Q-E shape changes disproportionally with significant red light response reduction >600 nm as the uncompensated impurity concentration changes , and 10 À11 s.…”
Section: Analytical Description Of Bias-dependent Quantum Efficiencymentioning
confidence: 99%
“…Although modelling and characterisation by isolating each of the three categories' properties is not trivial, numerical simulators such as TCAD [32], SCAPS [34], and PC1D [35] can provide further insight with the support of empirical results. To optimise modelling and simulation results, the main characterisation methods are time-resolved photoluminescence, photoluminescence, quantum efficiency, admittance spectroscopy (AS), deep-level transient spectroscopy, capacitance-voltage, and current-voltage methods, while varying temperature, frequency, light intensity, and light/voltage biases.…”
Section: Kesterite Device Modelling and Optimisationmentioning
confidence: 99%
“…From the single crystalline absorber study without grain boundary effects, interface recombination and the bulk minority carrier lifetime of the absorber are required to be improved. The bulk minority carrier lifetime is estimated to be between 2 and 7 ns with minority diffusion length 2.1 μm [32]. To improve the minority carrier lifetime and reduce bulk recombination, passivating bulk defects and associated interface defects is required.…”
Section: Kesterite Device Modelling and Optimisationmentioning
confidence: 99%
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