2023
DOI: 10.1016/j.jphotochem.2022.114406
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Silicon dioxide quantum dots anchored on the surface of carbon nanodiscs as photoluminescent probe for Cr(VI) detection

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Cited by 12 publications
(2 citation statements)
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“…As shown in Figure , the XRD exhibits a broad and strong peak at 2θ = 18.2°, which is the contribution of amorphous silicon. , …”
Section: Results and Discussionmentioning
confidence: 90%
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“…As shown in Figure , the XRD exhibits a broad and strong peak at 2θ = 18.2°, which is the contribution of amorphous silicon. , …”
Section: Results and Discussionmentioning
confidence: 90%
“…As shown in Figure 3, the XRD exhibits a broad and strong peak at 2θ = 18.2°, which is the contribution of amorphous silicon. 30,31 Rheological Property Analysis. To optimize the concentration of S-SiQDs, the viscosities of the HPAM/S-SiQDs hybrid solution with different concentrations of S-SiQDs were measured under a constant shear rate of 7.34 s −1 .…”
Section: ■ Experimental Partmentioning
confidence: 99%