2002
DOI: 10.1109/jmems.2002.800924
|View full text |Cite
|
Sign up to set email alerts
|

Silicon nitride cantilevers with oxidation-sharpened silicon tips for atomic force microscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
24
0

Year Published

2005
2005
2022
2022

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 53 publications
(24 citation statements)
references
References 11 publications
0
24
0
Order By: Relevance
“…The analysis of this figure shows that when low-stress viscosity is increased, the stress effects are more pronounced, leading to a sharper tip. Above a value of 5 10 P for , mechanical stresses and the induced nonlinearity are so high, and the algorithm cannot converge, with the relaxation factor value, which has been fixed . Inversely, as soon as the low-stress viscosity decreases and falls below the value of 10 P, the oxidation rate increases considerably and the profile curves assume the same shape as when mechanical stresses are not taken into account (the geometrical effect is no longer counterbalanced by the mechanical stresses).…”
Section: ) Plasticity Threshold Coefficient Influence: the Curves Inmentioning
confidence: 99%
See 1 more Smart Citation
“…The analysis of this figure shows that when low-stress viscosity is increased, the stress effects are more pronounced, leading to a sharper tip. Above a value of 5 10 P for , mechanical stresses and the induced nonlinearity are so high, and the algorithm cannot converge, with the relaxation factor value, which has been fixed . Inversely, as soon as the low-stress viscosity decreases and falls below the value of 10 P, the oxidation rate increases considerably and the profile curves assume the same shape as when mechanical stresses are not taken into account (the geometrical effect is no longer counterbalanced by the mechanical stresses).…”
Section: ) Plasticity Threshold Coefficient Influence: the Curves Inmentioning
confidence: 99%
“…They are integrated as emitter sources in field emitter devices for flat-panel display applications [1]- [4] as probes in atomic force microscopes [5] and scanning tunneling microscopes [6], as write/read/erase heads in nanomechanical storage devices [7], as microneedles for the mechanical insertion of genes in cells [8], and can be integrated as potential vibrating elements [9] in microelectromechanical systems (MEMS) devices [10], [11]. One main challenge of all the aforementioned applications is fabricating sharp tips such that the radius of curvature at their apex is less than 10 nm.…”
Section: Introductionmentioning
confidence: 99%
“…Sharp silicon tips have extensive applications in nanoelectromechanical system and biomedical field, such as AFM probe, field emission tip, and microneedle array (Folch et al 1997;Grow et al 2002;Yang et al 2005;Sun et al 2012;Kim et al 2012). Small tip apex and high aspect ratio are normally desired for good performance.…”
Section: Introductionmentioning
confidence: 99%
“…Work in the area of sensor and actuator development for atomic force microscopy [Manalis et al, 1996;Grow et al, 2002] has provided additional reasons to pursue physical modeling using microfabrication methods. Utilizing atomic force microscopy techniques, a model with active mechanisms could be developed.…”
Section: Introductionmentioning
confidence: 99%