Simulating interfering fringe displacements by lateral shifts of a camera for educational purposes

Abstract

In this manuscript we propose a simple method to emulate fringe displacements in a fringe pattern, due to the interference of two plane waves, by using lateral shifts of a CMOS detector under the scheme of a Twyman–Green interferometric setup, avoiding unwanted vibrations and the need for specific and expensive devices in order to accomplish the task. The simplicity of the proposed experimental setup allows it to be easily replicated and used for teaching or demonstrative purposes, essentially for undergraduate students.