Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2019) 2020
DOI: 10.22323/1.370.0007
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Simulation of new charge summing and hit allocation algorithm

Abstract: Modern VLSI technology allows the development of new class X-ray imaging detectors capableof capturing an image in various energy ranges in one shot. Such spectroscopic imaging detectorshave a high demand for the spatial and energy resolution of individual photons. With decreasing size of pixels, the charge cloud generated by the primary photon interaction, and in high-Zmaterials also by the fluorescent photon interaction, is shared across several pixels. That limitsboth spatial and spectroscopy resolution. Th… Show more

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