Simultaneous measurement of X-ray diffraction and ferroelectric polarization data as a function of applied electric field and frequency

Abstract

The characteristics of a new ferroelectric measurement system at the European Synchrotron Radiation Facility are presented. The electric-field-induced phase transitions of Pb(Mg(1/3)Nb(2/3))O(3)-xPbTiO(3) are determined via in situ measurements of electric polarization within the synchrotron diffraction beamline. Real-time data collection methods on single-crystal samples are employed as a function of frequency to determine the microstructural origin of piezoelectric effects within these materials, probing the dynamic ferroelectric response.

High temperature measurement and characterisation of piezoelectric properties

“…Whilst these techniques don't directly measure the piezoelectric effect, they are powerful tools for gaining information on strain in the crystal lattice and phase transitions [20], and the contributions of domain wall motion [21] and domain switching [22] to the piezoelectric coefficients. Diffraction studies of piezoelectric materials at temperatures up to 500 °C have helped understand the relationship between polarisation changes, piezoelectric properties and structural transformations in bismuth ferrite -lead titanate and related ceramics [23].…”

Simultaneous dynamic electrical and structural measurements of functional materials

“…This capability has been developed at the XMaS beamline, ESRF, France by the NPL and XMaS groups. 20 …”

“…The way the system records and builds up the material response to a cyclic electrical field is presented in more detail in Ref. 20.…”

“…The existing PE measurements setup was described in more detail in Ref. 20. The xray point detector (avalanche photodiode-APD), the x-ray monitor (ion chamber) as well as the waveform generated by the function generator, and the measured electrical signal from the specimen (either charge or current, depending on the setup) are also connected directly to the card.…”

“…Polarization data are collected in situ, 5,20,26 along with a measurement of global strain through the fringe and subfringe counting within a SIOS interferometer mounted above the sample as described in Sec. II E. X-ray data are collected in hkl-intensity format, where hkl represents the reciprocal space values in the crystallographic frame of reference.…”