Sin2 ψ analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure

Faurie, D.; Géandier, Guillaume; Renault, P.-O.; Bourhis, E. Le; Thiaudière, Dominique

doi:10.1016/j.tsf.2012.02.031

Cited by 11 publications

(6 citation statements)

References 25 publications

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“…XRD is widely used to measure the elastic strain in crystalline material [8,9]. The experimental geometry of the system is presented in Figure 3.…”

Section: Experimental Setup (Figure 3)mentioning

confidence: 99%

“…The energy of 20 keV (optimum for photons flux on BM02) is well adapted to optimize the film response. A XRD diagram has been recorded using an area detector (FReLoN, ESRF, XRD is widely used to measure the elastic strain in crystalline material [8,9]. The experimental geometry of the system is presented in Figure 3.…”

Section: Experimental Setup (Figure 3)mentioning

confidence: 99%

“…Geometrical configuration of the experiments performed at ESRF. Details on this configuration can be found in[8][9].…”

mentioning

confidence: 99%

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Determination of Residual Stresses in an Oxidized Metallic Alloy under Thermal Loadings

Wang

Grosseau-Poussard

Panicaud

et al. 2018

Metals

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In order to clarify the mechanical features of a metal under thermal cyclic loading for the system Ni30Cr-Cr 2 O 3 , a specific study has been carried out. In the present work, the residual stresses in both the metal and the oxide layer have been investigated. An adapted method is applied to process the experimental results that were obtained by using in-situ high temperature synchrotron diffraction at European Synchrotron Radiation Facility. The sin 2 ψ analysis provides information about the stress in metal and oxide. X-ray diffraction provides also the lattice parameter between crystallographic planes in the metal. To obtain correct stress values, a correction method is also proposed taking into account different discrepancies sources to ensure the equation of mechanical balance.2 of 23 works [4][5][6] concerning NiCr alloys, it has been shown that the growth stresses are released by creep in the fine grain chromia film (grain size usually ranging from 0.2 to 0.8 µm). Strain relaxation studies in the chromia layers were carried out in-situ, after imposing a sudden temperature change introducing a supplementary stress due to the mismatch of thermal expansion coefficients of the oxide and the alloy. Relaxation rates were found to be proportional to stress power σ n , with n ≤ 2, which is consistent with a diffusion-creep mechanism [4]. For the first time, the corresponding creep coefficients have been determined in the thermally grown chromia films [5]. Moreover, the creep thermal activation was studied, and the associated elementary mechanism for the creep behavior of chromia was identified as oxygen inward transport [7]. However, at the same time during oxidation, the metallic substrate is also able to develop stresses through its mechanical balance with the chromia TGO. Thus, in order to go further in the identification of the thermomechanical behavior of the metal/oxide system and in the understanding of the underlying physical mechanisms, it appears to be mandatory to investigate simultaneously and in real time the strain evolutions in the metal and in the oxide during oxidation. Aims of the WorkThus, the aim of the present work that is based upon the coupling of in-situ X-ray diffraction with oxidation in a furnace is twofold: perform measurements in the metal with sufficient accuracy to obtain its time evolution, and compare to the mechanical balance to validate the methodology. These measurements will also enable to validate a new method considering Fourier analysis, developed during a previous work [4]. To achieve such a goal, it is mandatory to investigate with accuracy the mechanical behavior under cyclic thermal loadings [6].

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“…XRD is widely used to measure the elastic strain in crystalline material [8,9]. The experimental geometry of the system is presented in Figure 3.…”

Section: Experimental Setup (Figure 3)mentioning

confidence: 99%

Section: Experimental Setup (Figure 3)mentioning

confidence: 99%

See 1 more Smart Citation

Determination of Residual Stresses in an Oxidized Metallic Alloy under Thermal Loadings

Wang

Grosseau-Poussard

Panicaud

et al. 2018

Metals

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“…2). Therefore, a single acquisition provides strain measurements in several orientations of a pole figure, as shown by Faurie et al (2013) and recalled briefly below.…”

Section: Measurement Methodsmentioning

confidence: 99%

In situmonitoring of X-ray strain pole figures of a biaxially deformed ultra-thin film on a flexible substrate

et al. 2014

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X‐ray strain pole figures (SPFs) have been captured in situ during biaxial deformation of a gold ultra‐thin film (thickness = 40 nm) deposited on a polymer substrate. An area detector was used to extract one line in the reciprocal space while the strained sample was rotated azimuthally step by step to produce the SPF. Such SPFs have been obtained for a textured anisotropic ultra‐thin film under controlled non‐equibiaxial loading using the SOLEIL synchrotron DIFFABS tensile device. The experimental setup allows the pole figure measurements of {111} and {200} reflections to be performed simultaneously. Interestingly, those two crystallographic directions are related to the two‐extreme elastic mechanical behaviour. The full directional lattice strain dependence (SPF) is obtained within 15 min and can be monitored step by step upon loading. This procedure gives an insight into ultra‐thin film mechanical response under complex biaxial loading.

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“…A 2D detector has been used for combined phase transition and residual stress along line scans [3,4]. 2D detectors are appropriate for large grain and textured samples and pole figures can be measured at fine steps for texture analysis [5,6]. Recently, Allahkarami et al introduced the idea of using 2D detectors with proper sample rotation and tilts for diffraction mapping on curved surfaces [7].…”

Section: Introductionmentioning

confidence: 99%

Three-dimensional x-ray diffraction detection and visualization

Allahkarami¹,

Hanan²

2014

Meas. Sci. Technol.

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A new method of sensing and analyzing three-dimensional (3D) x-ray diffraction (XRD) cones was introduced. Using a two-dimensional area detector, a sequence of frames was collected while moving the detector away from the sample with small equally spaced steps and keeping all other parameters constant. A 3D dataset was created from the subsequent frames. The 3D x-ray diffraction (XRD3) pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer and 2D x-ray diffraction (XRD2). The present work discusses some fundamentals about XRD3, such as the data collection method, 3D visualization, diffraction data interpretation and potential applications of XRD3.

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Sin2 ψ analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure

Cited by 11 publications

References 25 publications

Determination of Residual Stresses in an Oxidized Metallic Alloy under Thermal Loadings

Determination of Residual Stresses in an Oxidized Metallic Alloy under Thermal Loadings

In situmonitoring of X-ray strain pole figures of a biaxially deformed ultra-thin film on a flexible substrate

Three-dimensional x-ray diffraction detection and visualization

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