Abstract:Integrated circuit (IC) testing involves equipment and product interface board setup. Complex interfaces and obsolete components are some of the factors affecting the board functionality which results in manufacturing downtime. The legacy boards must be simplified so that it needs advanced tools for the lay-out and designing of test boards. This study proposes a solution for board functionality issues by re-spinning the legacy two-board interface into a single board interface. It converts the standard use of b… Show more
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