2014
DOI: 10.1103/physrevlett.112.256801
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Single-Electron Dynamics of an Atomic Silicon Quantum Dot on theHSi(100)(2×1)Surface

Abstract: Here we report the direct observation of single electron charging of a single atomic Dangling Bond (DB) on the H-Si(100) 2 × 1 surface. The tip of a scanning tunneling microscope is placed adjacent to the DB to serve as a single electron sensitive charge-detector. Three distinct charge states of the dangling bond, positive, neutral, and negative, are discerned. Charge state probabilities are extracted from the data, and analysis of current traces reveals the characteristic single electron charging dynamics. Fi… Show more

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Cited by 57 publications
(80 citation statements)
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“…If we further reduce the voltage to -1.4 V, -1.3 V and -1.2 V as seen in figures 5(i)-(k), respectively, the halo surrounding the dark DB becomes more and more extended. This can be explained by the effect of the TIBB, similarly to what was reported for empty-state imaging of DBs [22,23]. Indeed, the TIBB and the tunneling current from the silicon sample increase as the voltage is increased.…”
Section: Evolution Of Db Imaging With Voltage In Filled-statesupporting
confidence: 71%
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“…If we further reduce the voltage to -1.4 V, -1.3 V and -1.2 V as seen in figures 5(i)-(k), respectively, the halo surrounding the dark DB becomes more and more extended. This can be explained by the effect of the TIBB, similarly to what was reported for empty-state imaging of DBs [22,23]. Indeed, the TIBB and the tunneling current from the silicon sample increase as the voltage is increased.…”
Section: Evolution Of Db Imaging With Voltage In Filled-statesupporting
confidence: 71%
“…This was modeled in an earlier study by Livadaru et al [26] and was shown to arise from the nonequilibrium charging of the DB during STM imaging in unoccupied states. The dynamic aspect of it could be accessed experimentally using a low-temperature scanning tunneling microscope by studying the telegraph noise seen on the edge of the halo surrounding the DB [23].…”
Section: Influence On Stm Imaging Of Single Dbsmentioning
confidence: 99%
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“…These charge related halos have been consistently reported for single DBs, 19,21 but are completely absent when imaging DBDs. For single DBs it is typically possible to generate long-lived charged states that cause bright/dark halos in the STM images around the defects depending on the charge state and imaging conditions.…”
Section: Observation Of Dimer Switching On Ge(001):hsupporting
confidence: 55%