Single Event Effect Protection Design of Output Module of Relay Protection Device

Abstract

A design scheme for single event effect protection of output modules has been proposed, which combines software and hardware to solve the problem of output relay misoperation or refusal to operate caused by single event effect in the output module of relay protection devices. The core idea is to use dual path independent logic processing in software and dual circuit combination driving control in hardware to ensure that the output of the relay protection device will not misoperate when single event effects occur. The error detection and correction of instruction processing code is designed for MCU on-chip instruction storage areas that are easily affected by single event effects. It executes cyclically, allowing the output module to quickly return to normal after single-event effects occur, ensuring that the device output will not refuse to operate when it is expected to operate. When an irreparable error is detected, the output power supply is locked to ensure that the device output does not misoperate. Based on the experimental verification results, the reliability of the relay protection device is improved through the above methods.