2013 IEEE Radiation Effects Data Workshop (REDW) 2013
DOI: 10.1109/redw.2013.6658211
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Single Event Effects Sensitivity of 180 and 350 nm SiGe HBT Microcircuits

R. Koga
1
,
Clayton R. Paul
2
,
D. Romeo
3
et al.
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A Survey on Analog-to-Digital Converter Performance with Respect to Ionizing Radiation

Mueller
1
,
Weigel
2
,
Koelpin
3
2017
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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A Survey on Analog-to-Digital Converter Performance with Respect to Ionizing Radiation

Mueller
1
,
Weigel
2
,
Koelpin
3
2017
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
2
0
1
0
View full textAdd to dashboardCite
show abstract
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