Single event phenomena in atmospheric neutron environments

Gossett, C. A.; Hughlock, B.W.; Katoozi, M.; LaRue, G.; Wender, S. A.

doi:10.1109/23.273471

Cited by 67 publications

(13 citation statements)

References 16 publications

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“…At WNR, neutrons are produced in spallation reactions of 800 MeV protons incident on a tungsten target. This beam has been widely used for SEU testing [55], [56], [57], [58], [33]. 2.…”

Section: Neutron-induced Sermentioning

confidence: 99%

Characterization of soft errors caused by single event upsets in CMOS processes

Karnik

Hazucha

2004

IEEE Trans.Dependable and Secure Comput.

447

211

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Abstract-Radiation-induced single event upsets (SEUs) pose a major challenge for the design of memories and logic circuits in highperformance microprocessors in technologies beyond 90nm. Historically, we have considered power-performance-area trade offs. There is a need to include the soft error rate (SER) as another design parameter. In this paper, we present radiation particle interactions with silicon, charge collection effects, soft errors, and their effect on VLSI circuits. We also discuss the impact of SEUs on system reliability. We describe an accelerated measurement of SERs using a high-intensity neutron beam, the characterization of SERs in sequential logic cells, and technology scaling trends. Finally, some directions for future research are given.

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“…At WNR, neutrons are produced in spallation reactions of 800 MeV protons incident on a tungsten target. This beam has been widely used for SEU testing [55], [56], [57], [58], [33]. 2.…”

Section: Neutron-induced Sermentioning

confidence: 99%

Characterization of soft errors caused by single event upsets in CMOS processes

Karnik

Hazucha

2004

IEEE Trans.Dependable and Secure Comput.

447

211

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“…As technology advances, the effect of radiation [1][2][3] on microelectronic circuits is becoming more important [4,5]. One of these effects is the production of soft errors, which have a temporary influence in the system.…”

Section: Introductionmentioning

confidence: 99%

“…but are counted in m(3) and not in m(2). Now that the estimates of p(2) and p(3) have been obtained, and ignoring false MBUs with more than 3 errors, then: pð1Þ ffi 1 Àpð2Þ Àpð3Þ ð 16ÞWith the estimate of p(1), another refinement can be done to f ð2Þj Positions at distance of one or two of a cell affected by an SEU.…”

mentioning

confidence: 99%

A method to eliminate the event accumulation problem from a memory affected by multiple bit upsets

Maestro

Reviriego

2009

Microelectronics Reliability

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“…Data corruption of electronic devices under irradiation has been first studied in connection with aircraft electronics failures [1][2][3][4] due to the interactions of cosmic rays producing Single Event Effects (SEE) into the semiconductor nodes of digital memories. SEE are radiation-induced damaging events that can give an erroneous behaviour or a failure of an electronic device under irradiation.…”

Section: Introductionmentioning

confidence: 99%