2003 IEEE Radiation Effects Data Workshop
DOI: 10.1109/redw.2003.1281358
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Single event upset characterization of a personal computer micro-controller system-on-a-chip using proton irradiation

David M. Hiemstra
1
,
S. Yu
2
,
M. Pop
3

Abstract: Experimental single event upset characterization of a personal computer micro-controller system-on-a-chip using proton irradiation is presented. Results are compared with previous tests on other x86 microprocessors.

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