“…Various strategies have been proposed to probe the number and orientation of radiating dipoles in nanoemitters. A first range of methods used polarimetric analysis of the luminescence, either by decomposition into several polarization components , or by using a rotating polarizer to measure the degree of polarization. ,, A second class of methods uses the radiation pattern (angular distribution of the emission) measured by Fourier (back focal plane) imaging ,,, or indirectly by defocused imaging. ,− A widespread variant used polarized Fourier imaging to distinguish in-plane and out-of-plane dipole contributions. ,,− , Various other protocols have been introduced, such as separating different emission directions with an annular plate, comparing degrees of polarization with different collection apertures, using imaging aberrations, , probing the effect of a nearby interface on decay dynamics, , and separating spectrally the electric and magnetic contributions …”