2022
DOI: 10.1039/d2cp01250b
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Single-photoelectron collection efficiency in 4D ultrafast electron microscopy

Abstract: In femtosecond (fs) 4D ultrafast electron microscopy (UEM), a tradeoff is made between photoelectrons per packet and time resolution. One consequence of this can be longer-than-desirable acquisition times for low-density...

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Cited by 5 publications
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