2012
DOI: 10.1016/j.pcrysgrow.2012.03.001
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Solution epitaxy of patterned ZnO nanorod arrays by interference lithography

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Cited by 3 publications
(2 citation statements)
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“…The Zn 2p 3/2 peak (Figure 4c) is located at 1023 eV, which has shifted at ~2 eV compared to metallic zinc samples. This large shift is indicative of a greater degree of oxidation for the Zn atoms in the lattice [28]. Since the XRD patterns have shown that the ZnO (002) is the main peak, while morphologies have clearly changed, the results supported the idea that Al 2 O 3 did not doped structurally into the ZnO, as the structural feature of the ZnO remains Wurzite.…”
Section: Resultsmentioning
confidence: 61%
“…The Zn 2p 3/2 peak (Figure 4c) is located at 1023 eV, which has shifted at ~2 eV compared to metallic zinc samples. This large shift is indicative of a greater degree of oxidation for the Zn atoms in the lattice [28]. Since the XRD patterns have shown that the ZnO (002) is the main peak, while morphologies have clearly changed, the results supported the idea that Al 2 O 3 did not doped structurally into the ZnO, as the structural feature of the ZnO remains Wurzite.…”
Section: Resultsmentioning
confidence: 61%
“…Doped ZnO films are promising alternatives to replace indium-tinoxide (ITO) films as transparent conducting films due to their stable electrical and optical properties. The doping of Al [5], Ga [6], and In [7] in ZnO films has been widely studied to enhance n-type conductivity. The trivalent cation-doped ZnO films present good electrical conductivity and transparency over the visible spectrum.…”
Section: Introductionmentioning
confidence: 99%