Spatially Resolved Insight into the Chemical and Electronic Structure of Solution‐Processed Perovskites—Why to (Not) Worry about Pinholes

Hartmann, Claudia; Sadoughi, Golnaz; Félix, Roberto; Handick, Evelyn; Klemm, Hagen W.; Peschel, Gina; Madej, Ewa; Fuhrich, Alexander; Liao, Xian; Raoux, Simone; Abou‐Ras, Daniel; Wargulski, Dan R.; Schmidt, Thomas; Wilks, Regan G.; Snaith, Henry J.; Bär, Marcus

doi:10.1002/admi.201701420

Cited by 13 publications

(21 citation statements)

References 44 publications

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“…Areas with incomplete perovskite coverage showed an increase in Pb 4f binding energy with respect to bulk perovskite measurements, suggesting a downward band bending from the perovskite bulk to the perovskite/TiO 2 interface of up to 450 meV, Figure 8c. [81] The measured valence band maxima also indicated a sufficient energy barrier (~2 eV) between the HTL and ETL to block most leakage current even in devices with a relatively high density of pinholes. [81]…”

Section: Applications Of Peem To Perovskitesmentioning

confidence: 84%

Section: Peem Mechanismsmentioning

confidence: 99%

“…Establishing favorable band alignment over large areas between the hole transport layer (HTL) or the electron transport layer (ETL) and the perovskite is of great importance to device performance. [81,82,[145][146][147][148] Hartman et al [81] used PEEM to probe the valence band maxima at micron-scale defects formed in solution-processed perovskite films on TiO 2 ETLs, Figure 8a. They first determined the local surface composition of the perovskite layer using XAS-PEEM (Figure 8b).…”

Section: Applications Of Peem To Perovskitesmentioning

confidence: 99%

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X‐Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects

Kodur

Kumar

Luo

et al. 2020

Advanced Energy Materials

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X-ray microscopy can provide unique chemical, electronic, and structural insights into perovskite materials and devices leveraging bright, tunable synchrotron X-ray sources. Over the last decade, fundamental understanding of halide perovskites and their impressive performance in optoelectronic devices has been furthered by rigorous research regarding their structural and chemical properties. Herein, studies of perovskites are reviewed that have used X-ray imaging, spectroscopy, and scattering microscopies that have proven valuable tools toward understanding the role of defects, impurities, and processing on perovskite material properties and device performance. Together these microscopic investigations have augmented our understanding of the This article is protected by copyright. All rights reserved. 2 internal workings of perovskites and help steer the perovskite community toward promising directions. In many ways, X-ray microscopy of perovskites is still in its infancy, which leaves many exciting paths unexplored including new super-resolution, multimodal, in situ, and operando experiments. To explore possibilities, pioneering X-ray microscopy along these lines is briefly highlighted from other semiconductor systems including silicon, CdTe, GaAs, CuIn x Ga 1-x Se 2 , and organic photovoltaics. An overview is provided on the progress made in utilizing X-ray microscopy for perovskites and present opportunities and challenges for future work.

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Section: Applications Of Peem To Perovskitesmentioning

confidence: 84%

Section: Peem Mechanismsmentioning

confidence: 99%

Section: Applications Of Peem To Perovskitesmentioning

confidence: 99%

See 1 more Smart Citation

X‐Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects

Kodur

Kumar

Luo

et al. 2020

Advanced Energy Materials

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“…We have used metal oxides, organic semiconductors, and they seem to make very good electronic contact to the perovskite. [51][52][53] However, tuning the properties of those materials, for instance doping of the contact materials, has all been part of getting the efficiency up and going up this ladder towards the Shockley-Queisser limit. 54…”

Section: State-of-the Art Perovskite Materialsmentioning

confidence: 99%

The Path to Perovskite on Silicon PV

Snaith

Lilliu²

2018

SciVPro

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Henry J. Snaith is Professor of Physics in the Clarendon Laboratory at the University of Oxford and Fellow of the Royal Society. He has pioneered the field of perovskite solar cells and published more than 300 papers. He is the founder and Chief Scientist Officer of Oxford Photovoltaics, which holds the largest perovskite patent portfolio worldwide and focuses on developing and commercialising perovskite PV technology. In this interview, he discusses the present status and future prospects of perovskite PV. The interview is available at https://youtu.be/sbe9Z5oEs5o.

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“…The difference from a regular capacitor, besides the very high leakage current, is that the negative charge is not accumulated in one of the capacitor plates but instead is distributed throughout the titania. The study of these conduction aspects in TiO 2 is now becoming important given its active role in semiconductor devices such as solar cells (including dye‐sensitized and perovskite), resistive memories, MIS capacitors employing high‐ κ dielectrics and even transparent conducting oxides, to list a few. Recently the TiO 2 /Si heterojunction was used as a solar cell, taking advantage of the hole blocking capabilities of TiO 2 .…”

mentioning

confidence: 99%

Anomalous Current–Voltage Behavior in Al/TiO₂/n‐Si Structures

Razera

Boudinov

Rodrigues

et al. 2018

Physica Rapid Research Ltrs

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The current–voltage (J–V) curves of Al/TiO2/n‐Si structures present an anomalous behavior where the current becomes constant for a reverse bias higher than ≈0.65 V. Here we analyze devices fabricated by spin‐coating of an organometallic precursor and subsequent annealing in an O2 atmosphere. The details of the current saturation phenomenon are interpreted as a consequence of the formation of a depletion region in Si, which limits the voltage drop in the film and truncates the current. The analysis is supported experimentally by capacitance–voltage and photoconductance measurements. It is also shown that the saturation current can be controlled by modifying the film's deposition conditions, changing the barrier for electron injection from Al to TiO2.

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Spatially Resolved Insight into the Chemical and Electronic Structure of Solution‐Processed Perovskites—Why to (Not) Worry about Pinholes

Abstract: No conclusions can be (easily) drawn from the EDX maps based on the Cl K and N K fluorescence measured on the same sample spot as show in Figure 1a Figure 1a in the manuscript.

Cited by 13 publications

References 44 publications

X‐Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects

X‐Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects

The Path to Perovskite on Silicon PV

Anomalous Current–Voltage Behavior in Al/TiO₂/n‐Si Structures

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Spatially Resolved Insight into the Chemical and Electronic Structure of Solution‐Processed Perovskites—Why to (Not) Worry about Pinholes

Abstract: No conclusions can be (easily) drawn from the EDX maps based on the Cl K and N K fluorescence measured on the same sample spot as show in Figure 1a Figure 1a in the manuscript.

Cited by 13 publications

References 44 publications

X‐Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects

X‐Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects

The Path to Perovskite on Silicon PV

Anomalous Current–Voltage Behavior in Al/TiO2/n‐Si Structures

Contact Info

Product

Resources

About

Anomalous Current–Voltage Behavior in Al/TiO₂/n‐Si Structures