Spectral domain optical coherence tomography imaging with an integrated optics spectrometer

Abstract

Spectral domain optical coherence tomography imaging with an integrated optics spectrometer Nguyen, V.D.; Akca, B.I.; Wörhoff, K.; de Ridder, R.M.; Pollnau, M.; van Leeuwen, T.G.; Kalkman, J. General rightsIt is not permitted to download or to forward/distribute the text or part of it without the consent of the author(s) and/or copyright holder(s), other than for strictly personal, individual use, unless the work is under an open content license (like Creative Commons). Disclaimer/Complaints regulationsIf you believe that digital publication of certain material infringes any of your rights or (privacy) interests, please let the Library know, stating your reasons. In case of a legitimate complaint, the Library will make the material inaccessible and/or remove it from the website. Please Ask the Library: http://uba.uva.nl/en/contact, or a letter to: Library of the University of Amsterdam, Secretariat, Singel 425, 1012 WP Amsterdam, The Netherlands. You will be contacted as soon as possible. 20, 2011; revised March 3, 2011; accepted March 10, 2011; posted March 10, 2011 (Doc. ID 141269); published March 31, 2011We designed and fabricated an arrayed-waveguide grating (AWG) in silicon oxynitride as a spectrometer for spectral domain optical coherence tomography (SD-OCT). The AWG has a footprint of only 3:0 cm × 2:5 cm, operates at a center wavelength of 1300 nm, and has 78 nm free spectral range. OCT measurements are performed that demonstrate imaging up to a maximum depth of 1 mm with an axial resolution of 19 μm, both in agreement with the AWG design parameters. Using the AWG spectrometer combined with a fiber-based SD-OCT system, we demonstrate crosssectional OCT imaging of a multilayered scattering phantom.

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