2024 IEEE Physical Assurance and Inspection of Electronics (PAINE) 2024
DOI: 10.1109/paine62042.2024.10792717
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SPICED: Syntactical Bug and Trojan Pattern Identification in A/MS Circuits using LLM-Enhanced Detection

Jayeeta Chaudhuri,
Dhruv Thapar,
Arjun Chaudhuri
et al.
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