2021
DOI: 10.3390/coatings11050598
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Spray Pyrolysis Synthesis of Pure and Mg-Doped Manganese Oxide Thin Films

Abstract: Pure and Mg-doped manganese oxide thin films were synthesized on heated glass substrates using the spray pyrolysis technique. The surface chemical composition was investigated by the use of X-ray photoelectron spectroscopy (XPS). Structural and morphological properties were studied by using X-ray diffraction (XRD), scanning electron microscope (SEM) and atomic force microscopy (AFM). Optical properties were characterized by UV-visible spectroscopy. XPS spectra showed typical Mn (2p3/2), (2p1/2) and O (1s) peak… Show more

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Cited by 18 publications
(11 citation statements)
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“…As observed from Table 2, bandgap decreases for increase in concentration of Mg upto 12 wt% and then increases for 15wt% concentration of Mg [46]. This decrease in band gap is due to larger ionic radii of Mg 2+ ions than Mn 2+ ions which decrease crystallite size [47].…”
Section: Uv-vis Spectroscopymentioning
confidence: 73%
“…As observed from Table 2, bandgap decreases for increase in concentration of Mg upto 12 wt% and then increases for 15wt% concentration of Mg [46]. This decrease in band gap is due to larger ionic radii of Mg 2+ ions than Mn 2+ ions which decrease crystallite size [47].…”
Section: Uv-vis Spectroscopymentioning
confidence: 73%
“…Then, the average crystallite size, D , and the micro‐strain, ε , were investigated using two different routes, the conventional one presented in the Scherrer equation and the Williamson‐Hall method, respectively: [ 23,24 ] D0.28embadbreak=0.90.28emλβ0.28emcos()θ0.28em$$\begin{equation}D{\;} = \frac{{0.9{\;}\lambda }}{{\beta {\;}cos\left( \theta \right)}}{\;}\end{equation}$$ ε0.28embadbreak=β0.28emcos0.28em()θ0.28em40.28em$$\begin{equation}\varepsilon {\;} = \frac{{\beta {\;}cos{\;}\left( \theta \right){\;}}}{4}{\;}\end{equation}$$ β0.28emcos()θbadbreak=0.28emε(4sinθ)goodbreak+λFD$$\begin{equation}\beta {\;}\cos \left( \theta \right) = {\;}\varepsilon (4\sin \left( \theta \right)) + \frac{{\lambda F}}{D}\end{equation}$$With, λ ( Å ) the wavelength of the incident X‐ray beam of Cu Kα , θ ( rad ) the angle value of the selected diffraction peak, F shape factor (0.9), and β the full width at the half maximum FWHM ( rad ).…”
Section: Resultsmentioning
confidence: 99%
“…With, d hkl as the inter-plenary distance the h, k, and l are Miller indices and a, b, and c are the lattice parameters. Then, the average crystallite size, D, and the micro-strain, 𝜖, were investigated using two different routes, the conventional one presented in the Scherrer equation and the Williamson-Hall method, respectively: [23,24] D = 0.9 𝜆 𝛽 cos (𝜃)…”
Section: X-ray Diffraction (Xrd) Studymentioning
confidence: 99%
“…This structural compatibility ensures that the desired properties and functionalities of TiO 2 are maintained while incorporating Mg as a dopant [25]. Preparation methods such as spray pyrolysis, chemical vapour deposition (CVD), sputtering, dip coating, and spin coating have been used to fabricate pure and Mg-doped TiO 2 thin films [26][27][28][29][30][31]. In our novel study, we used spray pyrolysis to deposit nano-crystalline TiO 2 films on a glass substrate, with and without Mg doping and investigated them for gas sensing application.…”
Section: Introductionmentioning
confidence: 99%