2015
DOI: 10.1021/acs.analchem.5b01443
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Standardless Quantification of Heavy Elements by Electron Probe Microanalysis

Abstract: Absolute Mα and Mβ X-ray intensities were measured for the elements Pt, Au, Pb, U, and Th by electron impact for energies ranging from 6 to 38 keV. Experimental data were obtained by measuring the X-ray intensity emitted from bulk samples with an electron microprobe using high-resolution wavelength-dispersive spectrometers. Recorded X-ray intensities were converted into absolute X-ray yields by evaluation of the detector efficiency and then compared with X-ray intensities calculated by means of Monte Carlo sim… Show more

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Cited by 14 publications
(16 citation statements)
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“…Li et al (2014) and Zhao et al (2015) carried out their own X-ray yield measurements and showed that their experimental data compared favorably, to within ~10%, with the predictions of PENELOPE. More recently, Moy et al (2015) performed new absolute X-ray yield measurements for several high- Z element materials, which were found to agree satisfactorily with the predictions of PENEPMA. This allowed the development of a standardless method of analysis for samples containing actinide elements, for which reference standards are difficult to find.…”
Section: Examples Of Applications Of Penepmamentioning
confidence: 63%
“…Li et al (2014) and Zhao et al (2015) carried out their own X-ray yield measurements and showed that their experimental data compared favorably, to within ~10%, with the predictions of PENELOPE. More recently, Moy et al (2015) performed new absolute X-ray yield measurements for several high- Z element materials, which were found to agree satisfactorily with the predictions of PENEPMA. This allowed the development of a standardless method of analysis for samples containing actinide elements, for which reference standards are difficult to find.…”
Section: Examples Of Applications Of Penepmamentioning
confidence: 63%
“…The direct analysis of the light elements was performed taking into account the flatness and cleanness of the specimens, and also the processor characteristic (digital pulse). The ZAF correction factors were used for element quantification . The acronym ‘ZAF’ describes a procedure in which corrections for atomic number effects (Z), absorption (A), and fluorescence (F) are calculated separately from suitable physical models.…”
Section: Methodsmentioning
confidence: 99%
“…Briefly, the resin sections attached to glass slides were coated with carbon and analyzed in the Hitachi S-4700 scanning electron microscope equipped with the energy dispersive spectrometry (EDS) analytical system (liquid-nitrogen cooled lithium drifted silicon (Si(Li)) x-ray detector and the Thermo Scientific NSS spectral imaging system). The standardless method was used for quantification of the elemental composition (for details see Trincavelli et al 2014 ; Moy et al 2015 ). For the control, analyses were performed on the tissue-free resin fragments of the same section.…”
Section: Methodsmentioning
confidence: 99%