Static Characteristics and Avalanche Robustness of SiC Mosfet With P-Well Surface Doping Investigation

Lin, Zijie; Li, Jingang; Wang, Zhaoyi; Ling, Maoqing; Liu, Wen; Low, Kain Lu

doi:10.1109/icicdt63592.2024.10717698

2024 IEEE International Conference on IC Design and Technology (ICICDT) 2024

DOI: 10.1109/icicdt63592.2024.10717698

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Static Characteristics and Avalanche Robustness of SiC Mosfet With P-Well Surface Doping Investigation

Zijie Lin,

Jingang Li,

Zhaoyi Wang

et al.

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Static Characteristics and Avalanche Robustness of SiC Mosfet With P-Well Surface Doping Investigation

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