Static Characterization of Discrete MOSFETs after Rotational Stress Testing

Vannest, Jeremiah; Adamson, Zachary; Wolf, Kevin; Luscher, Anthony; Zhang, Julia; Liu, Shengyi; Gao, Lijun

doi:10.1109/ecce53617.2023.10362092

2023 IEEE Energy Conversion Congress and Exposition (ECCE) 2023

DOI: 10.1109/ecce53617.2023.10362092

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Static Characterization of Discrete MOSFETs after Rotational Stress Testing

Jeremiah Vannest,

Zachary Adamson,

Kevin Wolf

et al.

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Static Characterization of Discrete MOSFETs after Rotational Stress Testing

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References 8 publications

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