Statistical Analysis of Field-Emission Currents

Lachmann, Sagy; Jacewicz, M.; Profatilova, Iaroslava; Paszkiewicz, Jan; Wuensch, Walter; Ashkenazy, Yinon

doi:10.1103/physrevapplied.16.024007

Cited by 6 publications

(3 citation statements)

References 24 publications

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“…Probably, this battle could not be won in the absence of a good theory with a good method to analyze data. In the past years, new analytical formulae have been proposed to better describe experimental data [17][18][19][20][21][22][23] requiring to measure the field emission current, the voltage derivative of the current, current fluctuations or the current noise. A fully open source tool is even available 24 that includes corrections for small radius of curvature emitters.…”

Section: And Then Came Micro and Nanotechnologymentioning

confidence: 99%

All field emission experiments are noisy, {\ldots} are any meaningful?

Ayari,

Vincent,

Perisanu

et al. 2023

Preprint

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Representing field emission data on a Fowler-Nordheim plot is both very common and strongly not recommended. It leads to a spurious estimation of the emitter parameters despite a very good data fit. There is a lack of a reliable method of analysis and a proper estimation of the uncertainty in the extracted parameters. In this article, we show that the uncertainty in the estimation of the field enhancement factor or the emission area can be as high as ±50% even for a tungsten single emitter in good ultra-high vacuum conditions analyzed by the Murphy-Good model. Moreover, the choice of the exact Murphy-Good method can have a noticeable impact. We found that advanced analysis methods, based on the measurement of the differential conductance of the emitter, are so demanding in terms of emitter stability that up to now its requirements are probably out of reach in any field emission laboratory.

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Section: And Then Came Micro and Nanotechnologymentioning

confidence: 99%

All field emission experiments are noisy, {\ldots} are any meaningful?

Ayari,

Vincent,

Perisanu

et al. 2023

Preprint

View full text Add to dashboard Cite

show abstract

“…The most common explanation for this discrepancy is that there are sharp nano-protrusion on the metal surface which amplify the field by approximately 100 times. The breakdown reaction always starts with the field emission of electrons from the negatively charged electrode (the cathode) [4][5][6][7]. This fact plays an important role in the design of our resonant system because sharp corners on the surface of the cathode need to be avoided.…”

Section: Introductionmentioning

confidence: 99%

In situ resistivity measurement of metal surfaces to track down dislocations caused by high field conditioning

Coman,

Jacewicz,

Dancila

2023

Int. J. Microw. Wireless Technol.

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Conditioning of a metal surface in a high-voltage system is the progressive development of resistance to vacuum arcing over the operational life of the system. This is relevant for accelerator cavities, where high level of performance is only achievable after a long conditioning period. Beyond the accelerator research field, this is an important topic for any technology where breakdowns can cause device failure, either by directly disrupting device operation or by causing cumulative hardware damage.We are developing a direct method to measure the surface resistivity of a metal surface that is being conditioned with a HV DC system by inducing a high frequency (GHz) radio-frequency current in the parallel-plate electrode system. If the system can function as a resonant cavity, the surface resistivity data would be encoded in its quality factor (Q-factor). The changes in the resistivity measured in cryogenic conditions would indicate a formation of dislocations under the surface, something that has been speculated as an important process behind the conditioning.In this paper, we present two modified designs of the electrode system, which will act as a resonant cavity, the results of 3D EM simulations and experimental results regarding the characterization of this resonant system.

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“…These irregularities can be further sharpened by the locally enhanced electric fields [18], transforming the irregularities into field emitters. These may produce dark current bursts [19,20] that could eventually lead to BDs [21,22]. * anton.saressalo@helsinki.fi According to the statistical behavior of BD events, the latter were suggested to be divided into two major groups: primary (pBD) and secondary (sBD) BD events [23][24][25].…”

Section: Introductionmentioning

confidence: 99%

Linear voltage recovery after a breakdown in a pulsed dc system

Saressalo,

Wang,

Djurabekova

2021

Preprint

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Statistical Analysis of Field-Emission Currents

Cited by 6 publications

References 24 publications

All field emission experiments are noisy, {\ldots} are any meaningful?

All field emission experiments are noisy, {\ldots} are any meaningful?

In situ resistivity measurement of metal surfaces to track down dislocations caused by high field conditioning

Linear voltage recovery after a breakdown in a pulsed dc system

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