2019 25th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) 2019
DOI: 10.1109/therminic.2019.8923769
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Statistical Lock-in Thermography to Improve Contrast and Detectivity of ICs Thermal Maps

Maxime Cozzi
1
,
Jean-Marc Galliere
2
,
Philippe Maurine
3
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