Statistical Property of Breakdown Between Metal Electrodes in Vacuum

Toya,; Ueno,; Okada, Shima; Murai,

doi:10.1109/mper.1981.5511417

Cited by 3 publications

(3 citation statements)

References 1 publication

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“…The fundamental assumption is that the N number of micro-particles that potentially can produce breakdown is an increasing function of the W parameter; as shown in [6], this functional dependence, which is a cumulative probability, is expressed by the three parameters Weibull distribution:…”

Section: The Probabilistic Approachmentioning

confidence: 99%

“…Such observation, first proposed by Toya et al [6], which links a physical mechanism (the clump theory) to a statistical property of the electrodes (the N distribution of the micro-particles on the electrode surface) is the basis of the proposed method for voltage holding prediction, necessary for a reliable design of any electrostatic structure.…”

Section: Introductionmentioning

confidence: 99%

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Voltage holding prediction in multi-electrode multi-voltage systems insulated in vacuum

2010

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The voltage holding in the 1 MV ITER Neutral Beam Accelerator is recognized to be one of the most critical issues for long lasting beam operation, due to the complex electrostatic structure formed by differently shaped electrodes polarized at different potentials. At present, no model is available to predict the breakdown probability of electrostatic system with a comparable complexity degree. This paper is aimed at proposing an innovative modelling for the voltage breakdown prediction of such complex systems, based on the implementation of the micro particle (clump) induced breakdown Cranberg-Slivkov theory into a statistical approach.I.

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Section: The Probabilistic Approachmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Voltage holding prediction in multi-electrode multi-voltage systems insulated in vacuum

2010

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“…In the meantime, the concept of weak points [5,6] controlled by electric field on the electrode surface was introduced to analyze the statistical property of breakdown for VCB with multiple breaks.…”

Section: Introductionmentioning

confidence: 99%

Dielectric strength and statistical property of single and triple-break vacuum interrupters in series

Liao

Duan

Zou

et al. 2007

IEEE Trans. Dielect. Electr. Insul.

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The maximum possible improvement factor of vacuum circuit breaker (VCB) with multiple breaks compared with one-break, which had the same total gap length, was deduced. Based on the research on the breakdown weak points in high voltage vacuum gaps, a theoretic model was set up for describing the statistical property of multi-break VCB. Dielectric experiments were carried out on a commercial vacuum interrupter arrangements with single break or triple breaks in series under lightning impulse voltage. It shows that the more numbers in series are, the higher the breakdown voltage improvement factor is. The statistical results show that the triple-break vacuum interrupters in series have lower breakdown probability compared with a single-break one. It can be demonstrated in a preliminary study that the experimental results confirm the previous theoretical studies.Index Terms -Breakdown voltage improvement factor, breakdown statistical property, electrode stress, breakdown weak points.Zou ji-yan was born in Liaoning province, China, in 1954. He received the Ph.D. degree in electrical engineering from the Xi'an Jiaotong University. He is currently a professor at Dalian University of Technology, China. He has been engaged in the study of vacuum circuit breakers.

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Voltage Holding Prediction in Multi Electrode-multi Voltage Systems Insulated in Vacuum

Pilan

Veltri

Lorenzi

2011

IEEE Trans. Dielect. Electr. Insul.

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Statistical Property of Breakdown Between Metal Electrodes in Vacuum

Cited by 3 publications

References 1 publication

Voltage holding prediction in multi-electrode multi-voltage systems insulated in vacuum

Voltage holding prediction in multi-electrode multi-voltage systems insulated in vacuum

Dielectric strength and statistical property of single and triple-break vacuum interrupters in series

Voltage Holding Prediction in Multi Electrode-multi Voltage Systems Insulated in Vacuum

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