Step-Stress Accelerated Degradation Analysis for Highly Reliable Products

Reduction of reliability testings of data-measuring system due to its functional redundancy

“…Згодом нові рішення пробле-ми та розвиток багатьох положень, був відображений у працях інших дослідників, наприклад, [4,5]. Крім того, проблемою також займалася значна кількість зару-біжних науковців (див., наприклад, посилання у [6,7] та [8][9][10][11][12][13][14]). Роботи [4,5] покладені в основу проведе-ного дослідження.…”

Consistency analysis of degradation mechanism in step-stress accelerated degradation testing

“…Similar to the previous cumulative exposure model for the stepstress ALT [19,30], the degradation rate depends only on the current stress regardless of the accumulation history of the degradation process [24]. Let ω i+1 denote the equivalent duration time at the stress 1 i T + , which yields the same cumalative degradation amout as the termination time τ i at the stress i T of the SSADT.…”

A Bayes Inference for Step-Stress Accelerated Life Testing

“…Firstly, the use of SSALT can decrease the experiment duration without compromising on the accuracy of the estimates of the lifetime distribution (Zhao & Elsayed, 2005). Secondly, in comparison with parallel constant ALT, SSALT requires fewer test units to make tests more practical and economical (Tseng & Wen, 2000;Tang & et al, 2004). In addition, the adaptability of SSALT enables the researchers to adjust the stress level and stopping time as the information of a new product's characteristic is gathered over time.…”