Stimulated Raman microscopy without ultrafast lasers

Abstract

Stimulated Raman scattering (SRS) microscopy is a powerful tool for chemically-sensitive non-invasive optical imaging. However, the short-pulse laser sources, which are currently being employed for this imaging technique, are still expensive and require substantial maintenance to provide temporal and spectral overlap. SRS imaging, which utilizes cw laser sources, has a major advantage over pulsed lasers, as it eliminates the possibility of cell damage due to exposure to high-intensity light radiation, while substantially reducing the cost and complexity of the set-up and keeping a subcellular spatial resolution. As a proof-of-principle, we demonstrate microscopic imaging of dimethyl sulfoxide using two independent, commonly used and inexpensive lasers: a diode-pumped, intracavity doubled 532 nm laser and a He-Ne laser operating at 633 nm. In our proof-of-principle experience, dimethyl sulfoxide acts as a contrast agent providing Raman scattering signal. The 532 nm and 633 nm lasers act as excitation and probe sources, respectively [1].