Stress induced degradation modes in CIGS mini-modules

Kempe, Michael; Terwilliger, K. M.; Tarrant, D.

doi:10.1109/pvsc.2008.4922497

Cited by 21 publications

(17 citation statements)

References 4 publications

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“…Many types of photovoltaic (PV) technologies are sensitive to moisture [1][2][3][4][5]. The use of an impermeable front-sheet and back-sheet (e.g.…”

Section: Introductionmentioning

confidence: 99%

Evaluation and modeling of edge-seal materials for photovoltaic applications

Kempe

Dameron

Moricone

et al. 2010

2010 35th IEEE Photovoltaic Specialists Conference

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Because of the sensitivity of some photovoltaic devices to moisture-induced corrosion, they are packaged using impermeable front-and back-sheets along with an edge seal to prevent moisture ingress. Evaluation of edge seal materials can be difficult because of the low permeation rates involved and/or non-Fickian behavior. Here, using a Ca film deposited on a glass substrate, we demonstrate the evaluation of edge seal materials in a manner that effectively duplicates their use in a photovoltaic application and compare the results with standard methods for measuring water vapor transport. We demonstrate how moisture permeation data from polymer films can be used to estimate moisture ingress rates and compare the results of these two methods. Encapsulant materials were also evaluated for comparison and to highlight the need for edge seals. Of the materials studied, desiccant filled polyisobutylene materials demonstrate by far the best potential to keep moisture out for a 20 to 30 y lifetime.

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“…Many types of photovoltaic (PV) technologies are sensitive to moisture [1][2][3][4][5]. The use of an impermeable front-sheet and back-sheet (e.g.…”

Section: Introductionmentioning

confidence: 99%

Evaluation and modeling of edge-seal materials for photovoltaic applications

Kempe

Dameron

Moricone

et al. 2010

2010 35th IEEE Photovoltaic Specialists Conference

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“…Localized heating of the CIGS scribe line is the result of high resistivity TCO that occurred from oxidation during high temperature stressing. [9] Nonuniform heating of the scribe line that connects neighboring cells is visible in this image and correlates with residual CIGS material that is left in the scribe line. Images with this resolution would not be possible with conventional infrared imaging.…”

Section: A Scribe Line Defectsmentioning

confidence: 84%

Thermoreflectance imaging of defects in thin-film solar cells

Kendig

Alers

Shakouri

2010

2010 IEEE International Reliability Physics Symposium

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Abstract-We have identified and characterized various defects in thin-film a-Si and CIGS solar cells with sub-micron spatial resolution using thermoreflectance imaging. A megapixel silicon-based CCD was used to obtain noncontact thermal images simultaneously with visible electroluminescence (EL) images. EL can be indicative of pre-breakdown sites due to trap assisted tunneling and stress induced leakage currents. Physical defects appear at reverse bias voltages of 8V in a-Si samples. Linear and nonlinear shunt defects are investigated as well as electroluminescent breakdown regions at reverse biases as low as 4.5V. Pre-breakdown sites with electroluminescence are investigated.

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“…The mechanisms for failure (including sensitivity to moisture, diffusion within the layers, problems at scribe lines, and the effects of non-uniform layer coating) are not thoroughly understood; so many years of research will be required to fully elucidate these. Kempe, at NREL, subjected copper indium gallium selenide (CIGS) minimodules to humid conditions and found an increase in series resistance that appeared to be associated with a reaction between the ZnO and water [41]. This sensitivity may be compounded by the sensitivity of other layers [42].…”

Section: Issue Description Tests References Randd Needmentioning

confidence: 99%

Photovoltaic-reliability R&D toward a solar-powered world

2009

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The continued exponential growth of photovoltaic technologies paves a path to a solar-powered world, but requires continued progress toward low-cost, high-reliability, and high-performance PV systems. High reliability is an essential element in achieving low-cost solar electricity by reducing operation and maintenance (O&M) costs and by extending system lifetime and availability, but these attributes are difficult to verify at the time of installation. Utilities, financiers, homeowners, and planners are demanding this information in order to evaluate their financial risk as a prerequisite to large investments. Reliability research and development (R&D) is needed to build market confidence by improving product reliability and by improving predictions of system availability, O&M cost, and system lifetime. Universities, industry, National Labs, and other research entities can be most effective by working together and in complementary ways. The Department of Energy supports a variety of research projects to improve PV-system reliability. These projects and current reliability issues for each PV technology are surveyed.

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Stress induced degradation modes in CIGS mini-modules

Cited by 21 publications

References 4 publications

Evaluation and modeling of edge-seal materials for photovoltaic applications

Evaluation and modeling of edge-seal materials for photovoltaic applications

Thermoreflectance imaging of defects in thin-film solar cells

Photovoltaic-reliability R&D toward a solar-powered world

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