Structural and chemical effects on the SiKβ X-ray emission spectra for silicates and silico-phosphates

Study of ion beam induced chemical effects in silicon with a downsized high resolution X-ray spectrometer for use with focused ion beams

“…Most of the studies have been concentrated on the comparison of energy shis of the diagram or satellite emission lines of a specic element in various compounds, reecting the change in bond energy in the presence of the neighbouring ligand on Si Ka [30][31][32][33][34] and Si Kb lines. 30,[35][36][37][38][39][40] Although a majority of studies measured energy shis, relative intensities of different satellite lines and/or satellite and diagram lines can also be used in chemical speciation avoiding the requirement for WD systems with energy resolutions below 1 eV. Fischer and Baun proposed to use the intensity ratio of multiple ionization satellite lines a 4 and a 3 as a test of oxidation on metallic targets.…”

Chemical shift of characteristic X-ray wavelength in silicon-containing ceramics due to neutron irradiation

“…It was concluded that it was influenced by the valence number, coordination and/or electronegativity of cations. Okura and Sudoh [10] and Leone [11] observed the chemical shift of Si-Ka and Si-Kb in oxides and glasses and that of sixcoordinated silicon showed a higher energy shift than four-coordinated silicon.…”