2014
DOI: 10.18052/www.scipress.com/ilcpa.41.100
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Structural and Morphological Studies of Nanocrystalline Ceramic BaSr<sub>0</sub>.<sub>9</sub>Fe<sub>0</sub>.<sub>1</sub>TiO<sub>4</sub>

Abstract: The development of lead-free piezoelectric materials have gained great attention for the consideration of environmental protection. Nanosized BaSr 0 . 9 Fe 0 . 1 TiO 4 , a lead free perovskite phase structured ceramic was prepared via a high-energy ball milling process through mechanically assisted synthesis. The sample was analyzed by X-ray Diffraction (XRD), SEM and EDX. The XRD results and XPERT-PRO software analysis confirmed the orthorhombic system of the sample. Scanning Electron Microscopy (SEM) analysi… Show more

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Cited by 27 publications
(3 citation statements)
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“…The principle that decreasing grain or crystalline size leads towards increasing diffraction width, which is also known as peak broadening, is used for determining the size of grains. Thus, widening of an XRD peak is an indicator that small crystallite does not contain enough planes viable for producing complete destructive interference [53,54]. The size of particles can be estimated through the following Scherrer equation [55]:…”
Section: Crystal Size and Orientationmentioning
confidence: 99%
“…The principle that decreasing grain or crystalline size leads towards increasing diffraction width, which is also known as peak broadening, is used for determining the size of grains. Thus, widening of an XRD peak is an indicator that small crystallite does not contain enough planes viable for producing complete destructive interference [53,54]. The size of particles can be estimated through the following Scherrer equation [55]:…”
Section: Crystal Size and Orientationmentioning
confidence: 99%
“…The electrocaloric adiabatic temperature variation (ΔT) and responsivity (ζ) were achieved by the indirect method from recorded (P-E) hysteresis loops at 1 Hz as a function of temperature. The crystallite size was determined using Scherrer's formula [30] as following :…”
Section: Characterization Equipmentsmentioning
confidence: 99%
“…In (2015) the BSFTO nanoparticles with solid state-of-the-art technique were characterized by X-ray diffraction (XRD) and SEM analyzes in the Reenu Jacob and Jayakumari Isac [7]. BSFTO crystallite growth is investigated by X-ray peak expansion methods, such as Scherrer and Williamson Hall Plot Analysis (W-H).…”
Section: Review Of Literaturementioning
confidence: 99%