Structural and Optical Characterization of Cu2Se0.8S0.2 Thin Films Deposited by Thermal Evaporation

Abstract

A simple cost thermal evaporation deposition technique was used to prepare of Cu2SeS thin films on the substrates made of glass at RT with thickness ( 500 + − 20 ) nm . Structural, and optical properties of these films were investigated. The films were structurally characterized using X-ray diffraction XRD analyses, the film samples were morphologically characterized using atomic force microscopy (AFM), and optical UV-Vis spectroscopy was also to characterize the samples. The films have been treated at deferent temperatures (403, 453 &503) K for 1 hour, X-ray diffraction (XRD-with wavelength 1.54 A) study the structure properties of this films suggest a cubic structure and have prominent (111) orientation. AFM analysis, it is evident that Cu2SeS film is polycrystalline in nature, and that crystallite size and average grain size for films after annealing were increasing. The optical absorption coefficient (α) of the film was evaluated using absorbance spectra in the wavelength range (400-1100) nm. The direct band gap of about 2.2 eV, decrease by increasing annealing temperature, The structure and the optical characteristics of these films may have practical applications in renewable energy.