2015
DOI: 10.1016/j.tsf.2015.01.036
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Structural and optical properties of MoS2 layers grown by successive two-step chemical vapor deposition method

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Cited by 19 publications
(11 citation statements)
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“…2e ). These are typical signs for MoS 2 films 32 34 . To characterize the flakes’ structure in more details, a high resolution scanning electron microscope (SEM) image was taken in Fig.…”
Section: Resultsmentioning
confidence: 64%
“…2e ). These are typical signs for MoS 2 films 32 34 . To characterize the flakes’ structure in more details, a high resolution scanning electron microscope (SEM) image was taken in Fig.…”
Section: Resultsmentioning
confidence: 64%
“…Finally, the light was be converted into electrical signal by the charge coupled device (CCD), which is a special semiconductor device with many photosensitive elements in the LabRam HR Evolution with the single grating. The specific test conditions were: Spectral range of 300–450 cm −1 ; PL of 600–800 nm; spectral resolution ≤ 0.65 cm −1 ; spatial resolution was Lateral ≤ 1 μm, longitudinal ≤ 2 μm; Raman spectrum of 10 mW; PL spectrum of 25 mW; the scan time of 10 s; and the accumulation time of 3 s. The Raman and photoluminescence characterization were measured by using the LabRam HR Evolution with 532 nm laser and 50 × objective [23,24,25]. At the same time, in order to master the growth mechanism of monolayer MoS 2 , the X-ray photoelectron spectroscopy and Atomic Force Microscope, were also used.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The weak peak located at ∼227.0 eV is assigned to S 2s. For S 2p, two peaks centered at ∼164.0 and ∼162.8 eV are assigned to S 2p 1/2 and 2p 3/2 , respectively . The O 1s core level includes three subpeaks, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%