2016
DOI: 10.1016/j.jallcom.2015.10.287
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Structural and optical properties of CuIn 1-x Ga x Se 2 nanoparticles synthesized by solvothermal route

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Cited by 15 publications
(8 citation statements)
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“…The decrease in the crystallite size is probably due to the small ion size of Zn 2+ (radius = 0.74 Å) compared to that of In 3+ (radius = 0.81 Å). These results are similar to those obtained with CuInGaSe powders [11] and radiofrequency (RF)-sputtered CuInZnS thin films [14], where the incorporation of impurities as Zn or Ga in the CuInSe 2 compound reduced the intensity of the peaks and the grain sizes from 24.8 to 22.5 nm. The behavior of Zn is the same as the behavior of Ga in CuInSe powders.…”
Section: Structural Properties Of Cuin 1-x Zn X Se 2 Nanopowderssupporting
confidence: 85%
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“…The decrease in the crystallite size is probably due to the small ion size of Zn 2+ (radius = 0.74 Å) compared to that of In 3+ (radius = 0.81 Å). These results are similar to those obtained with CuInGaSe powders [11] and radiofrequency (RF)-sputtered CuInZnS thin films [14], where the incorporation of impurities as Zn or Ga in the CuInSe 2 compound reduced the intensity of the peaks and the grain sizes from 24.8 to 22.5 nm. The behavior of Zn is the same as the behavior of Ga in CuInSe powders.…”
Section: Structural Properties Of Cuin 1-x Zn X Se 2 Nanopowderssupporting
confidence: 85%
“…Therefore, the band gap of these compounds increases [31]. All these results show that the role of zinc is identical to that of aluminum in Cu (In, Al) Se 2 powders [32,33] as well as gallium in Cu (In, Ga) Se 2 powders [11,31,34,35]. In the latter case, Zn is cheaper than Ga concerning the ease of acquisition because it is a natural component of the Earth's crust and is an integral part of our environment, while Ga is a rare chemical element.…”
Section: Optical Properties Of Cuin 1-x Zn X Se 2 Nanopowdersmentioning
confidence: 68%
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“…Figure 3f shows the strain (ε) due to crystal imperfections and distortions of the Ga 2 O 3 films that were annealed at 600, 700, 800, and 900 • C, as calculated using the equation ε = ω/4tanθ, where ω is the FWHM of the predominant diffraction peak and θ is the Bragg angle corresponding to the diffraction peak obtained from the XRD data [45][46][47]. The strains along the (-402) orientation decreased from a maximum of 8.562 × 10 −3 at 600 • C to a minimum of 6.187 × 10 −3 at 900 • C. With an increase in the annealing temperature from 600 to 900 • C and a relaxation in the compressive strain, an increasing number of Ga 3+ ions occupied the oxygen tetrahedral sites from the oxygen octahedral sites; therefore, the volume of the unit cell showed the slightly volumetric contraction at 700 • C although the compressive strain released rapidly, while volumetric expansion occurred for compact structures at 800-900 • C as the compressive strain released, as shown in Figure 3e,f.…”
Section: Resultsmentioning
confidence: 99%