Structural, magnetic and magnetotransport properties of thin films of the Heusler alloys Cu2MnAl, Co2MnSi, Co2MnGe and Co2MnSn

Geiersbach, U.; Bergmann, A.; Westerholt, K.

doi:10.1016/s0304-8853(01)00866-6

Cited by 132 publications

(66 citation statements)

References 7 publications

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“…The CMS thin films (20,50, and 100 nm in thickness) were deposited on a-plane sapphire substrates by UHVmagnetron rf-sputtering using pure Ar at a pressure of 5 Â 10 À3 mbar as sputter gas. The growth conditions (growth rate, Ar pressure, and substrate temperature) were preliminarily tested in order to optimize the structural quality of the films [20].…”

Section: Sample Preparation and Structural Propertiesmentioning

confidence: 99%

“…The growth conditions (growth rate, Ar pressure, and substrate temperature) were preliminarily tested in order to optimize the structural quality of the films [20]. The found best parameters are: base pressure of 2 Â 10 À9 mbar in the sputtering system, sputtering rate of 0.03 nm/s for CMS and of 0.025 nm/s for the previously deposited vanadium seed underlayer.…”

Section: Sample Preparation and Structural Propertiesmentioning

confidence: 99%

“…(20, 50, and 100 nm) were grown by radio frequency (RF) sputtering on a-plane sapphire substrates. Our X-rays diffraction (XRD) study shows that, in all the samples, the cubic h110i CMS axis is normal to the substrate and that six well defined preferential in-plane orientations are present.…”

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confidence: 99%

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Structural and magnetic properties of Co₂MnSi thin films

Belmeguenai

Zighem

Faurie

et al. 2012

Physica Status Solidi (a)

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is an open access repository that collects the work of Arts et Métiers ParisTech researchers and makes it freely available over the web where possible. (20, 50, and 100 nm) were grown by radio frequency (RF) sputtering on a-plane sapphire substrates. Our X-rays diffraction (XRD) study shows that, in all the samples, the cubic h110i CMS axis is normal to the substrate and that six well defined preferential in-plane orientations are present. Static and dynamic magnetic properties were investigated using vibrating sample magnetometry (VSM) and microstrip line ferromagnetic resonance (MS-FMR), respectively. From the resonance measurements versus the direction and the amplitude of an applied magnetic field, most of the magnetic parameters are derived, i.e.: the magnetization, the gyromagnetic factor, the exchange stiffness coefficient, and the magnetic anisotropy terms. The in-plane anisotropy results from the superposition of two terms showing a twofold and a fourfold symmetry, respectively. The observed behavior of the hysteresis loops is in agreement with this complex form of the in-plane anisotropy.

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Section: Sample Preparation and Structural Propertiesmentioning

confidence: 99%

Section: Sample Preparation and Structural Propertiesmentioning

confidence: 99%

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Structural and magnetic properties of Co₂MnSi thin films

Belmeguenai

Zighem

Faurie

et al. 2012

Physica Status Solidi (a)

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“…Cobalt-based full-Heusler alloys have been considered potential candidates for showing HMF properties. Their structural and magnetic properties have been intensively investigated experimentally [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18] and theoretically [19][20][21][22][23] because they have comparatively high Curie temperatures T C . In particular, Co 2 Cr 1−x Fe x Al (CCFA) is expected to have suitable electro-magnetic properties for injecting a spinpolarized current [16,22].…”

Section: Introductionmentioning

confidence: 99%

Epitaxial growth of Co2Cr0.6Fe0.4Al Heusler alloy thin films on MgO (0 0 1) substrates by magnetron

Matsuda

Kasahara

Marukame

et al. 2006

Journal of Crystal Growth

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We demonstrate that single-crystalline epitaxial films of the Heusler alloy Co 2 Cr 0.6 Fe 0.4 Al (CCFA) featuring excellent surface flatness can be grown on MgO (001) substrates by magnetron sputtering deposition at room temperature and subsequent annealing at high temperatures. X-ray pole figure measurements reveal that the films exhibit the B2-type structure and the [100] direction of the films is rotated by 45˚from the [100] direction of the MgO substrate. Moreover, their Curie temperatures and saturation magnetizations are also improved by annealing. The surface roughness is about 0.2 nm rms according to atomic force microscopy.

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“…4. Some of the experimental measurements of the electrical resistivity of Co-based Heusler alloys are reported by several workers, 7 µΩcm [15] for the single crystal, 106 µΩcm [16] for the thin film of Co 2 MnSi, and 0.2 µΩcm [17] for the single crystal, 41 µΩcm [18] for the thin film of Co 2 FeSi, respectively. These data seem to be good agreement with the calculated results, although there is no guarantee that the degree of the order, i.e.…”

Section: Resultsmentioning

confidence: 97%

First-principles study for electronic structure and physical property of Co-based Heusler alloys

Kota

Sakuma

2011

J. Phys.: Conf. Ser.

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Abstract.The statistical investigation of the physical property of Co-based Heusler alloys with the atomic composition or configuration dependence are carried out in first-principles approach. In particular, the electronic structure, magnetic moment and electrical resistivity due to disorder alloy effects of Co2MnAl1−zSiz (0.0 < z < 1.0) and Co2Mn1−yFeySi (0.0 < y < 1.0) with the L21, B2 and A2 structure are calculated by using the tight-binding linear muffin-tin orbital method combined with the coherent potential approximation based on the local spindensity functional approximation and by using the Kubo-Greenwood formula, respectively. The obtained results indicate that these properties of the Co-based Heusler alloys significantly depend on the atomic configuration and composition, especially, they are sensitive to the existence of the half-metallic property.

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Structural, magnetic and magnetotransport properties of thin films of the Heusler alloys Cu2MnAl, Co2MnSi, Co2MnGe and Co2MnSn

Cited by 132 publications

References 7 publications

Structural and magnetic properties of Co₂MnSi thin films

Structural and magnetic properties of Co₂MnSi thin films

Epitaxial growth of Co2Cr0.6Fe0.4Al Heusler alloy thin films on MgO (0 0 1) substrates by magnetron

First-principles study for electronic structure and physical property of Co-based Heusler alloys

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Structural, magnetic and magnetotransport properties of thin films of the Heusler alloys Cu2MnAl, Co2MnSi, Co2MnGe and Co2MnSn

Cited by 132 publications

References 7 publications

Structural and magnetic properties of Co2MnSi thin films

Structural and magnetic properties of Co2MnSi thin films

Epitaxial growth of Co2Cr0.6Fe0.4Al Heusler alloy thin films on MgO (0 0 1) substrates by magnetron

First-principles study for electronic structure and physical property of Co-based Heusler alloys

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Structural and magnetic properties of Co₂MnSi thin films

Structural and magnetic properties of Co₂MnSi thin films