Studies of YBCO strip lines under voltage pulses: optimization of the design of fault current limiters

Decroux, M.; Antognazza, L.; Reymond, S.; Paul, Willi; Chen, M.; Fischer, Ø.

doi:10.1109/tasc.2003.812959

Cited by 13 publications

(12 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This has been experimentally confirmed on a 5 kW FCL on 2 inch wafer [3]. However, during severe tests, the materials have burned due to local high temperature values.…”

Section: Introductionmentioning

confidence: 59%

See 1 more Smart Citation

3-D Finite Element Simulations of Strip Lines in a YBCO/Au Fault Current Limiter

Duron

Antognazza

Decroux

et al. 2005

IEEE Trans. Appl. Supercond.

Self Cite

View full text Add to dashboard Cite

Abstract-Geometrical aspects of the design of fault current limiters (FCL) have a great impact on their performances. Recently, the University of Geneva have made certain optimizations by splitting the FCL into many small dissipative lengths in order to achieve a distributed transition along the device.For this paper, we have performed new 3D finite element method (FEM) simulations for studying the behavior of strip lines of a YBCO/Au FCL in an AC nominal use (sinusoidal current at industrial frequency) up to 3 Ic. The very large aspect ratio of the device needs a particular attention to the modeling and meshing process.The numerical results show that presence of sharp corners can influence the performance of the device. Due to the high value of the electric field in these areas, the local losses are much higher than in the case of smooth corners, and this may lead to burning and cracking the wafer. Irreversible damage experiments have confirmed these locations.In this paper we proposed new geometries, taking into account the length of the connecting path and the corners optimization in order to decrease the risk of very high localized losses in the meander.

show abstract

“…This has been experimentally confirmed on a 5 kW FCL on 2 inch wafer [3]. However, during severe tests, the materials have burned due to local high temperature values.…”

Section: Introductionmentioning

confidence: 59%

“…However, it has been observed that only a part of the FCL is actually limiting the current and is also supporting all the dissipated power [2]. To improve the performance of these FCLs, the University of Geneva has proposed a new design by splitting the initial dissipative area into many dissipative lengths [3].…”

Section: Introductionmentioning

confidence: 99%

3-D Finite Element Simulations of Strip Lines in a YBCO/Au Fault Current Limiter

Duron

Antognazza

Decroux

et al. 2005

IEEE Trans. Appl. Supercond.

Self Cite

View full text Add to dashboard Cite

show abstract

“…With this design, the normal transition would formerly occur in the narrower segments and the heat arising from this overheated sections will rapidly propagate along the whole meander path (i.e. including also the wider parts), hence leading to a complete and more homogeneous transition (Decroux et al, 2003;Antognazza et al, 2005;Duron et al, 2005;Antognazza et al, 2007;.…”

Section: Introductionmentioning

confidence: 99%

Thermal Behaviour and Refrigeration of High-Temperature Superconducting Fault Current Limiters and Microlimiters

Veira¹,

Osorio²,

Vidal³

2012

Superconductors - Properties, Technology, and Applications

View full text Add to dashboard Cite

“…inductive-resistive), have being extendedly studied [1][2][3][4][5][6][7]. The refrigeration and thermal behaviour of the superconducting elements are aspects of crucial importance for the overall performance of these devices.…”

Section: Introductionmentioning

confidence: 99%

Thermal behaviour of high-temperature superconducting fault current limiters: Application to microlimiters

Lorenzo-Fernández

Osorio

Veira

et al. 2010

Journal of Physics and Chemistry of Solids

View full text Add to dashboard Cite

a b s t r a c tFault current limiters are one of the most promising applications of high-temperature superconductors. Two important and interrelated aspects of these devices are their thermal behaviour and their refrigeration. Here we will present some results of our recent researches about this topic concerning the possibility of using superconducting thin-film microbridges as very efficient microlimiters intended to operate at very low powers as could be superconducting microelectronics applications (SQUID based electronics, infrared detectors, etc.).& 2010 Published by Elsevier Ltd.Superconducting fault current limiters (SFCL) based on high temperature superconductors (HTSC) of different types, inductive, resistive or hybrid (i.e. inductive-resistive), have being extendedly studied [1][2][3][4][5][6][7]. The refrigeration and thermal behaviour of the superconducting elements are aspects of crucial importance for the overall performance of these devices. Thin film samples present several advantages to be used in current limiting applications [4,8,9]. We have studied the use of this kind of samples in two up to now nearly unexplored configurations. One is a hybrid limiting device based on meandered HTSC thin-films refrigerated by using a thermoacoustic refrigerator [10], and the other a resistive FCL based on ''thermally small'' superconducting microbridges [9] intended to operate at very low powers (SQUID based electronics, infrared detectors, etc.). In this work we will summarize some of our recent results on this last issue.In Fig. 1 we show a typical electric field versus current density (EÀ J) curve, corresponding to one of the microbridges (denoted BS7) used in our experiments. This microbridge, whose length, width and thickness are, respectively, 385 mm, 28 mm and 300 nm, and with T c ¼ 88.6 K, has been grown on a sapphire substrate. The two characteristic current densities are indicated in this figure:The critical, J c , at which dissipation first appears, and the so-called supercritical, J * , at which the microbridge is triggered into highly dissipative states. Let us note here that we have chosen for our studies microbridges of these dimensions to guarantee a good thermal behaviour before, during and after the current fault, as we will see below. In addition, the widths of our microbridges are well above the threshold at which J * is sample-width dependent [11]. The strong increase of E for current densities around J * make this type of samples very useful for FCL. However, the current is effectively limited only for electric fields or, equivalently, applied voltages well above that at which the limiter is triggered from normal operation (sample in the superconducting state) to current fault mode. In addition, once J * is attained, a thermal runaway [12,13] can be provoked which causes the reduction of the circulating current well below the nominal value (i.e., the current in normal operation without a fault) or very important damage on the microbridge (that can be even burnt out).The superconducting ...

show abstract

Studies of YBCO strip lines under voltage pulses: optimization of the design of fault current limiters

Cited by 13 publications

References 8 publications

3-D Finite Element Simulations of Strip Lines in a YBCO/Au Fault Current Limiter

3-D Finite Element Simulations of Strip Lines in a YBCO/Au Fault Current Limiter

Thermal Behaviour and Refrigeration of High-Temperature Superconducting Fault Current Limiters and Microlimiters

Thermal behaviour of high-temperature superconducting fault current limiters: Application to microlimiters

Contact Info

Product

Resources

About