Studies on single-event phenomena using the heavy-ion microbeam at JAERI

Hirao, Toshio; Mori, Hidenobu; Laird, J.S.; Onoda, Shinobu; Wakasa, Takeshi; Abe, Hiroshi; Itoh, Hisayoshi

doi:10.1016/s0168-583x(03)01013-9

Cited by 10 publications

(5 citation statements)

References 14 publications

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“…Heavy ion microbeam of 15 MeV-O, 15-MeV Ni or 8 MeV-C was used for IBIC measurement [32]. The count rate was precisely evaluated using Si Surface Barrier Diode (SBD) detector placed in front of the SC-CVD detector on a linear drive and controlled from approximately 20 cps to 10 5 cps by installing attenuator [34]. The diamond detector was fixed on the movable stage to control the irradiation position.…”

Section: Heavy Ion Irradiation Experimentsmentioning

confidence: 99%

Continuous observation of polarization effects in thin SC-CVD diamond detector designed for heavy ion microbeam measurement

Kada

Iwamoto

Satoh

et al. 2014

Nuclear Instruments and Methods in Physics Research Section B:

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Continuous irradiation effects on a thin-film diamond detector were investigated for the utilization of these films as a detector for heavy ion microbeams. Temporal signal degradation in the energy spectrum was frequently observed during the focused heavy ion microbeam irradiation. To measure the temporal response to the each ion incidents, focused heavy ion microbeam with different beam fluence rates were irradiated to a Single Crystal (SC)-CVD diamond film detector with thickness of 50 μm. The responses to each ion were continuously observed and characterized by ion beam-induced charge (IBIC) measurement system. Heavy ions with short penetration path in diamond generate the large difference in mean path of electrons and holes, which is inverted by changing bias polarity. Signal degradation condition was relied on the bias polarity under the irradiation of heavy ions with short penetration length in the diamond. The continuous observation of IBIC signals revealed that temporal degradation in pulse height of signals, so called polarization effects, seems to be mainly caused by the hole trapping in this diamond crystal.

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Section: Heavy Ion Irradiation Experimentsmentioning

confidence: 99%

Continuous observation of polarization effects in thin SC-CVD diamond detector designed for heavy ion microbeam measurement

Kada

Iwamoto

Satoh

et al. 2014

Nuclear Instruments and Methods in Physics Research Section B:

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“…where (x o , θ o , y o , Φ o ) represents the position and divergence angle of a beam particle in the object plane, δ o is the particle momentum relative to the mean momentum, the demagnification of the system is x|x −1 and y|y −1 in the image plane, x|θ and y|Φ are the astigmatism coefficients, x|θδ and y|Φδ are the chromatic aberration coefficients, and x|θ 3 , x|θΦ 2 , y|Φ 3 and y|θ 2 Φ are the spherical aberration coefficients. In a well-focused system, the astigmatism coefficients are zero.…”

Section: Intrinsic Aberrationsmentioning

confidence: 99%

“…With further research on astronautics, the current trend in microbeam facilities is to develop higher energy heavy ion microbeams with better spatial resolution, permitting the investigation of an important unanswered question: whether neurons that survive traversal by highly charged, high energy particles develop changes as a late consequence of the damage they incurred [1] . In addition, a high energy heavy ion beam is very useful in breeding with mutation inducement [2] and elucidating the mechanism of single event phenomena in semiconductor devices for space craft [3] .…”

Section: Introductionmentioning

confidence: 99%

Design of the IMP microbeam irradiation system for 100 MeV/u heavy ions

Sheng¹,

Song²,

Zhang³

et al. 2009

Chinese Phys. C

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“…bystander effect, apoptosis for biological cells and singleevent effect in IC chips [1,2]. TIARA was equipped with a variable-energy AVF cyclotron (K = 110) which provides various ions; 5 through 90 MeV protons and 2.5 through 27 MeV/u heavy-ions [3].…”

Section: Introductionmentioning

confidence: 99%